MS

Mehul D. Shroff

FS Freeescale Semiconductor: 91 patents #3 of 3,767Top 1%
NU Nxp Usa: 16 patents #74 of 2,066Top 4%
QU Quicklogic: 5 patents #14 of 70Top 20%
Motorola: 3 patents #3,303 of 12,470Top 30%
🗺 Texas: #324 of 125,132 inventorsTop 1%
Overall (All Time): #10,533 of 4,157,543Top 1%
117
Patents All Time

Issued Patents All Time

Showing 76–100 of 117 patents

Patent #TitleCo-InventorsDate
8595667 Via placement and electronic circuit design processing method and electronic circuit design utilizing same Douglas M. Reber, Edward O. Travis 2013-11-26
8581390 Semiconductor device with heat dissipation Edward O. Travis, Douglas M. Reber 2013-11-12
8574987 Integrating formation of a replacement gate transistor and a non-volatile memory cell using an interlayer dielectric Mark D. Hall 2013-11-05
8569816 Isolated capacitors within shallow trench isolation Mark D. Hall 2013-10-29
8564044 Non-volatile memory and logic circuit process integration Mark D. Hall 2013-10-22
8557650 Patterning a gate stack of a non-volatile memory (NVM) using a dummy gate stack 2013-10-15
8536007 Non-volatile memory cell and logic transistor integration Mark D. Hall 2013-09-17
8536006 Logic and non-volatile memory (NVM) integration Mark D. Hall 2013-09-17
8524557 Integration technique using thermal oxide select gate dielectric for select gate and replacement gate for logic Mark D. Hall, Frank K. Baker, Jr. 2013-09-03
8510695 Techniques for electromigration stress determination in interconnects of an integrated circuit Ertugrul Demircan 2013-08-13
8431471 Method for integrating a non-volatile memory (NVM) Jane A. Yater, Sung-Taeg Kang 2013-04-30
8415217 Patterning a gate stack of a non-volatile memory (NVM) with formation of a capacitor Bradley P. Smith 2013-04-09
8399310 Non-volatile memory and logic circuit process integration Mark D. Hall 2013-03-19
8389365 Non-volatile memory and logic circuit process integration Mark D. Hall 2013-03-05
8343842 Method for reducing plasma discharge damage during processing David M. Schraub, Terry A. Breeden, James D. Legg, Ruiqi Tian 2013-01-01
8318576 Decoupling capacitors recessed in shallow trench isolation Mark D. Hall 2012-11-27
8318577 Method of making a semiconductor device as a capacitor Mark D. Hall 2012-11-27
8202778 Patterning a gate stack of a non-volatile memory (NVM) with simultaneous etch in non-NVM area 2012-06-19
8021957 Process of forming an electronic device including insulating layers having different strains Paul A. Grudowski, Venkat R. Kolagunta 2011-09-20
7951695 Method for reducing plasma discharge damage during processing David M. Schraub, Terry A. Breeden, James D. Legg, Ruiqi Tian 2011-05-31
7858487 Method and apparatus for indicating directionality in integrated circuit manufacturing Edward O. Travis, Donald E. Smeltzer, Traci L. Smith 2010-12-28
7843011 Electronic device including insulating layers having different strains Paul A. Grudowski, Venkat R. Kolagunta 2010-11-30
7741221 Method of forming a semiconductor device having dummy features Ruiqi Tian, Willard E. Conley 2010-06-22
7670760 Treatment for reduction of line edge roughness Jinmiao J. Shen, Jonathan Cobb, William D. Darlington, Brian Fisher, Mark D. Hall +2 more 2010-03-02
7635920 Method and apparatus for indicating directionality in integrated circuit manufacturing Edward O. Travis, Donald E. Smeltzer, Traci L. Smith 2009-12-22