ET

Edward O. Travis

FS Freeescale Semiconductor: 44 patents #22 of 3,767Top 1%
Motorola: 12 patents #718 of 12,470Top 6%
NU Nxp Usa: 3 patents #546 of 2,066Top 30%
AM AMD: 2 patents #3,994 of 9,279Top 45%
Overall (All Time): #40,632 of 4,157,543Top 1%
59
Patents All Time

Issued Patents All Time

Showing 1–25 of 59 patents

Patent #TitleCo-InventorsDate
10014257 Apparatus and method for placing stressors within an integrated circuit device to manage electromigration failures Douglas M. Reber, Mehul D. Shroff 2018-07-03
9685405 Fuse/resistor utilizing interconnect and vias and method of making Mehul D. Shroff, Douglas M. Reber 2017-06-20
9652577 Integrated circuit design using pre-marked circuit element object library Ertugrul Demircan, Douglas M. Reber, Michael A. Stockinger 2017-05-16
9515006 3D device packaging using through-substrate posts Douglas M. Reber, Mehul D. Shroff 2016-12-06
9508702 3D device packaging using through-substrate posts Douglas M. Reber, Mehul D. Shroff 2016-11-29
9508701 3D device packaging using through-substrate pillars Douglas M. Reber, Mehul D. Shroff 2016-11-29
9455220 Apparatus and method for placing stressors on interconnects within an integrated circuit device to manage electromigration failures Mehul D. Shroff, Douglas M. Reber 2016-09-27
9443804 Capping layer interface interruption for stress migration mitigation Mehul D. Shroff, Douglas M. Reber 2016-09-13
9445050 Teleconferencing environment having auditory and visual cues Douglas M. Reber 2016-09-13
9318409 Integrated circuit heater for reducing stress in the integrated circuit material and chip leads of the integrated circuit, and for optimizing performance of devices of the integrated circuit Douglas M. Reber, Mehul D. Shroff 2016-04-19
9245817 Semiconductor device with embedded heat spreading Douglas M. Reber, Mehul D. Shroff 2016-01-26
9236344 Thin beam deposited fuse Douglas M. Reber, Mehul D. Shroff 2016-01-12
9142507 Stress migration mitigation utilizing induced stress effects in metal trace of integrated circuit device Mehul D. Shroff, Douglas M. Reber 2015-09-22
9122829 Stress migration mitigation Douglas M. Reber, Mehul D. Shroff 2015-09-01
9122812 Semiconductor device with vias on a bridge connecting two buses Douglas M. Reber, Mehul D. Shroff 2015-09-01
9082824 Method for forming an electrical connection between metal layers Douglas M. Reber, Mehul D. Shroff 2015-07-14
9064785 Electronic device including a capacitor and a process of forming the same Bradley P. Smith 2015-06-23
9032615 Method for forming an electrical connection between metal layers Douglas M. Reber, Mehul D. Shroff 2015-05-19
8972922 Method for forming an electrical connection between metal layers Douglas M. Reber, Mehul D. Shroff 2015-03-03
8946000 Method for forming an integrated circuit having a programmable fuse Douglas M. Reber, Mehul D. Shroff 2015-02-03
8941242 Method of protecting against via failure and structure therefor Mehul D. Shroff, Douglas M. Reber 2015-01-27
8856705 Mismatch verification device and methods thereof Mehul D. Shroff, Sanjay R. Parihar 2014-10-07
8832624 Multi-layer process-induced damage tracking and remediation Mehul D. Shroff, Douglas M. Reber 2014-09-09
8796841 Semiconductor device with embedded heat spreading Douglas M. Reber, Mehul D. Shroff 2014-08-05
8741743 Integrated assist features for epitaxial growth Omar Zia, Nigel G. Cave, Venkat R. Kolagunta, Ruiqi Tian 2014-06-03