WY

Wendy H. Yeh

Applied Materials: 13 patents #1,030 of 7,310Top 15%
Overall (All Time): #385,727 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8125034 Graded ARC for high NA and immersion lithography Martin Jay Seamons, Matthew Spuller, Sum-Yee Betty Tang, Kwangduk Douglas Lee, Sudha Rathi 2012-02-28
7776516 Graded ARC for high NA and immersion lithography Martin Jay Seamons, Matthew Spuller, Sum-Yee Betty Tang, Kwangduk Douglas Lee, Sudha Rathi 2010-08-17
7737040 Method of reducing critical dimension bias during fabrication of a semiconductor device Christopher Dennis Bencher, Melvin Montgomery, Alexander Buxbaum, Yung-Hee Yvette Lee, Jian Ding +1 more 2010-06-15
7718081 Techniques for the use of amorphous carbon (APF) for various etch and litho integration schemes Wei Liu, Jim Zhongyi He, Sang-Hoon Ahn, Meihua Shen, Hichem M'Saad +1 more 2010-05-18
7642195 Hydrogen treatment to improve photoresist adhesion and rework consistency 2010-01-05
7407893 Liquid precursors for the CVD deposition of amorphous carbon films Martin Jay Seamons, Sudha Rathi, Deenesh Padhi, Andy Luan, Sum-Yee Betty Tang +6 more 2008-08-05
7365014 Reticle fabrication using a removable hard mask Christopher Dennis Bencher, Melvin Montgomery, Alexander Buxbaum, Yung-Hee Yvette Lee, Jian Ding +1 more 2008-04-29
7262106 Absorber layer for DSA processing Luc Van Autryve, Chris Bencher, Dean Jennings, Haifan Liang, Abhilash J. Mayur +2 more 2007-08-28
7109087 Absorber layer for DSA processing Luc Van Autryve, Chris Bencher, Dean Jennings, Haifan Liang, Abhilash J. Mayur +2 more 2006-09-19
7105442 Ashable layers for reducing critical dimensions of integrated circuit features Hongching Shan, Kenny L. Doan, Jingbao Liu, Michael Barnes, Hong Dang Nguyen +4 more 2006-09-12
7094442 Methods for the reduction and elimination of particulate contamination with CVD of amorphous carbon Martin Jay Seamons, Sudha Rathi, Heraldo Botelho 2006-08-22
7064078 Techniques for the use of amorphous carbon (APF) for various etch and litho integration scheme Wei Liu, Jim Zhongyi He, Sang-Hoon Ahn, Meihua Shen, Hichem M'Saad +1 more 2006-06-20
6853043 Nitrogen-free antireflective coating for use with photolithographic patterning Sang-Hoon Ahn, Christopher Dennis Bencher, Hichem M'Saad, Sudha Rathi 2005-02-08