Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9881766 | Differential imaging with pattern recognition for process automation of cross sectioning applications | — | 2018-01-30 |
| 9735066 | Surface delayering with a programmed manipulator | Michael Schmidt | 2017-08-15 |
| 9297727 | Differential imaging with pattern recognition for process automation of cross sectioning applications | — | 2016-03-29 |
| 7737040 | Method of reducing critical dimension bias during fabrication of a semiconductor device | Christopher Dennis Bencher, Melvin Montgomery, Yung-Hee Yvette Lee, Jian Ding, Gilad Almogy +1 more | 2010-06-15 |
| 7468227 | Method of reducing the average process bias during production of a reticle | Melvin Montgomery | 2008-12-23 |
| 7365014 | Reticle fabrication using a removable hard mask | Christopher Dennis Bencher, Melvin Montgomery, Yung-Hee Yvette Lee, Jian Ding, Gilad Almogy +1 more | 2008-04-29 |