Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9449826 | Graded well implantation for asymmetric transistors having reduced gate electrode pitches | G Robert Mulfinger, Andy Wei, Jan Hoentschel | 2016-09-20 |
| 9269631 | Integration of semiconductor alloys in PMOS and NMOS transistors by using a common cavity etch process | Stephan Kronholz | 2016-02-23 |
| 9035306 | Adjusting configuration of a multiple gate transistor by controlling individual fins | Jan Hoentschel, Robert Neil Mulfinger | 2015-05-19 |
| 8969916 | Strain enhancement in transistors comprising an embedded strain-inducing semiconductor alloy by creating a patterning non-uniformity at the bottom of the gate electrode | Stephan Kronholz, Markus Lenski | 2015-03-03 |
| 8828819 | Strain enhancement in transistors comprising an embedded strain-inducing semiconductor alloy by creating a patterning non-uniformity at the bottom of the gate electrode | Stephen Kronholz, Markus Lenski | 2014-09-09 |
| 8772878 | Performance enhancement in PMOS and NMOS transistors on the basis of silicon/carbon material | Jan Hoentschel, Belinda Hannon | 2014-07-08 |
| 8735253 | Adjusting of a non-silicon fraction in a semiconductor alloy during transistor fabrication by an intermediate oxidation process | Stephan Kronholz, Martin Trentzsch | 2014-05-27 |
| 8664049 | Semiconductor element formed in a crystalline substrate material and comprising an embedded in situ doped semiconductor material | Stephan Kronholz, Roman Boschke, Maciej Wiatr | 2014-03-04 |
| 8530894 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Casey Scott, Andy Wei, Markus Lenski, Andreas Gehring | 2013-09-10 |
| 8466520 | Transistor with an embedded strain-inducing material having a gradually shaped configuration | Stephan Kronholz, Gunda Beernink | 2013-06-18 |
| 8450124 | Adjusting configuration of a multiple gate transistor by controlling individual fins | Jan Hoentschel, Robert Neil Mulfinger | 2013-05-28 |
| 8357573 | Strain enhancement in transistors comprising an embedded strain-inducing semiconductor alloy by creating a patterning non-uniformity at the bottom of the gate electrode | Stephan Kronholz, Markus Lenski | 2013-01-22 |
| 8338274 | Transistor device comprising an embedded semiconductor alloy having an asymmetric configuration | Stephan Kronholz, Gunda Beernink, Jan Hoentschel | 2012-12-25 |
| 8278174 | In situ formed drain and source regions including a strain-inducing alloy and a graded dopant profile | Jan Hoentschel, Uwe Griebenow | 2012-10-02 |
| 8227266 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Casey Scott, Andy Wei, Markus Lenski, Andreas Gehring | 2012-07-24 |
| 8202777 | Transistor with an embedded strain-inducing material having a gradually shaped configuration | Stephan Kronholz, Gunda Beernink | 2012-06-19 |
| 8154084 | Performance enhancement in PMOS and NMOS transistors on the basis of silicon/carbon material | Jan Hoentschel, Belinda Hannon | 2012-04-10 |
| 8138050 | Transistor device comprising an asymmetric embedded semiconductor alloy | Jan Hoentschel, Robert Neil Mulfinger, Casey Scott | 2012-03-20 |
| 8124467 | Reducing silicide resistance in silicon/germanium-containing drain/source regions of transistors | Stephan Kronholz, Maciej Wiatr | 2012-02-28 |
| 8018260 | Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation | Maciej Wiatr, Jan Hoentschel | 2011-09-13 |
| 7855118 | Drive current increase in transistors by asymmetric amorphization implantation | Jan Hoentschel, Uwe Griebenow | 2010-12-21 |
| 7713763 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Casey Scott, Andy Wei, Markus Lenski, Andreas Gehring | 2010-05-11 |
| 7616021 | Method and device for determining an operational lifetime of an integrated circuit device | Amado Ramirez, Michael Süß | 2009-11-10 |
| 7206703 | System and method for testing packaged devices using time domain reflectometry | Michael Z. Su, Amado Ramirez, Gary Alexander Cousins | 2007-04-17 |
| 4588831 | Platinum complex compounds of substituted 5,8-dihydroxyl-1,4-naphthoquinone, and process for their production and use | Angelos N. Sagredos, Antonius S. Mellidis | 1986-05-13 |