Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9450073 | SOI transistor having drain and source regions of reduced length and a stressed dielectric material adjacent thereto | Andy Wei, Thorsten Kammler, Roman Boschke | 2016-09-20 |
| 8652913 | Method for forming silicon/germanium containing drain/source regions in transistors with reduced silicon/germanium loss | Andreas Gehring, Maciej Wiatr, Andy Wei, Thorsten Kammler, Roman Boschke | 2014-02-18 |
| 8530894 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Vassilios Papageorgiou, Andy Wei, Markus Lenski, Andreas Gehring | 2013-09-10 |
| 8373244 | Temperature monitoring in a semiconductor device by thermocouples distributed in the contact structure | Anthony Mowry, Roman Boschke | 2013-02-12 |
| 8334569 | Transistor with embedded Si/Ge material having enhanced across-substrate uniformity | Robert Neil Mulfinger, Andy Wei, Jan Hoentschel | 2012-12-18 |
| 8227266 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Vassilios Papageorgiou, Andy Wei, Markus Lenski, Andreas Gehring | 2012-07-24 |
| 8212184 | Cold temperature control in a semiconductor device | Anthony Mowry, Maciej Wiatr, Ralf Richter | 2012-07-03 |
| 8183100 | Transistor with embedded SI/GE material having enhanced across-substrate uniformity | Robert Neil Mulfinger, Andy Wei, Jan Hoentschel | 2012-05-22 |
| 8138050 | Transistor device comprising an asymmetric embedded semiconductor alloy | Vassilios Papageorgiou, Jan Hoentschel, Robert Neil Mulfinger | 2012-03-20 |
| 8093634 | In situ formed drain and source regions in a silicon/germanium containing transistor device | Anthony Mowry, Andy Wei, Andreas Gehring | 2012-01-10 |
| 7897451 | Method for creating tensile strain by selectively applying stress memorization techniques to NMOS transistors | Maciej Wiatr, Andreas Gehring, Peter Javorka, Andy Wei | 2011-03-01 |
| 7811876 | Reduction of memory instability by local adaptation of re-crystallization conditions in a cache area of a semiconductor device | Anthony Mowry, Frank Wirbeleit | 2010-10-12 |
| 7713763 | Test structure for monitoring process characteristics for forming embedded semiconductor alloys in drain/source regions | Anthony Mowry, Vassilios Papageorgiou, Andy Wei, Markus Lenski, Andreas Gehring | 2010-05-11 |