BB

Basab Bandyopadhyay

AM AMD: 56 patents #111 of 9,279Top 2%
🗺 Texas: #1,392 of 125,132 inventorsTop 2%
Overall (All Time): #44,856 of 4,157,543Top 2%
56
Patents All Time

Issued Patents All Time

Showing 26–50 of 56 patents

Patent #TitleCo-InventorsDate
5998293 Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect Robert Dawson, Mark W. Michael, William S. Brennan, H. Jim Fulford, Fred N. Hause 1999-12-07
5968843 Method of planarizing a semiconductor topography using multiple polish pads Robert Dawson, H. Jim Fulford, Fred N. Hause, Mark W. Michael, William S. Brennan 1999-10-19
5970362 Simplified shallow trench isolation formation with no polish stop Christopher F. Lyons, Nick Kepler, Olov Karlsson, Larry Wang, Effiong Ibok 1999-10-19
5970363 Shallow trench isolation formation with improved trench edge oxide Nick Kepler, Olov Karlsson, Larry Wang, Effiong Ibok, Christopher F. Lyons 1999-10-19
5953626 Dissolvable dielectric method Fred N. Hause, Robert Dawson, H. Jim Fulford, Mark W. Michael, William S. Brennan 1999-09-14
5930645 Shallow trench isolation formation with reduced polish stop thickness Christopher F. Lyons, Nick Kepler, Olov Karlsson, Larry Wang, Effiong Ibok 1999-07-27
5926713 Method for achieving global planarization by forming minimum mesas in large field areas Fred N. Hause, H. Jim Fulford, Robert Dawson, Mark W. Michael, William S. Brennan 1999-07-20
5926717 Method of making an integrated circuit with oxidizable trench liner Mark W. Michael, Robert Dawson, H. Jim Fulford, Fred N. Hause, William S. Brennan 1999-07-20
5924008 Integrated circuit having local interconnect for reducing signal cross coupled noise Mark W. Michael, Robert Dawson, H. Jim Fulford, Fred N. Hause, William S. Brennan 1999-07-13
5899727 Method of making a semiconductor isolation region bounded by a trench and covered with an oxide to improve planarization Fred N. Hause, H. Jim Fulford, Robert Dawson, Mark W. Michael, William S. Brennan 1999-05-04
5894168 Mask generation technique for producing an integrated circuit with optimal polysilicon interconnect layout for achieving global planarization Mark W. Michael, Robert Dawson, Fred N. Hause, H. Jim Fulford, William S. Brennan 1999-04-13
5854515 Integrated circuit having conductors of enhanced cross-sectional area H. Jim Fulford, Robert Dawson, Fred N. Hause, Mark W. Michael, William S. Brennan 1998-12-29
5854131 Integrated circuit having horizontally and vertically offset interconnect lines Robert Dawson, Mark W. Michael, H. Jim Fulford Jr., Fred N. Hause, William S. Brennan 1998-12-29
5851913 Method for forming a multilevel interconnect structure of an integrated circuit by a single via etch and single fill process William S. Brennan, Robert Dawson, H. Jim Fulford, Fred N. Hause, Mark W. Michael 1998-12-22
5850105 Substantially planar semiconductor topography using dielectrics and chemical mechanical polish Robert Dawson, Mark W. Michael, H. Jim Fulford, Fred N. Hause, William S. Brennan 1998-12-15
5846876 Integrated circuit which uses a damascene process for producing staggered interconnect lines H. Jim Fulford, Robert Dawson, Fred N. Hause, Mark W. Michael, William S. Brennan 1998-12-08
5847462 Integrated circuit having conductors of enhanced cross-sectional area with etch stop barrier layer H. Jim Fulford, William S. Brennan, Fred N. Hause, Robert Dawson, Mark W. Michael 1998-12-08
5830773 Method for forming semiconductor field region dielectrics having globally planarized upper surfaces William S. Brennan, Robert Dawson, Fred N. Hause, H. Jim Fulford, Mark W. Michael 1998-11-03
5827776 Method of making an integrated circuit which uses an etch stop for producing staggered interconnect lines H. Jim Fulford, Robert Dawson, Fred N. Hause, Mark W. Michael, William S. Brennan 1998-10-27
5814555 Interlevel dielectric with air gaps to lessen capacitive coupling H. Jim Fulford, Robert Dawson, Fred N. Hause, Mark W. Michael, William S. Brennan 1998-09-29
5811334 Wafer cleaning procedure useful in the manufacture of a non-volatile memory device James F. Buller, Shyam Garg, Nipendra J. Patel, Thomas E. Spikes, Jr. 1998-09-22
5792706 Interlevel dielectric with air gaps to reduce permitivity Mark W. Michael, Robert Dawson, Fred N. Hause, H. Jim Fulford, William S. Brennan 1998-08-11
5783481 Semiconductor interlevel dielectric having a polymide for producing air gaps William S. Brennan, Robert Dawson, H. Jim Fulford, Fred N. Hause, Mark W. Michael 1998-07-21
5783864 Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect Robert Dawson, Mark W. Michael, William S. Brennan, H. Jim Fulford, Fred N. Hause 1998-07-21
5767012 Method of forming a recessed interconnect structure H. Jim Fulford, Robert Dawson, Fred N. Hause, Mark W. Michael, William S. Brennan 1998-06-16