Issued Patents 2023
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11855066 | Semiconductor structure and manufacturing method thereof | Hsiang-Tai Lu, Shuo-Mao Chen, Feng-Cheng Hsu, Chao-Hsiang Yang, Shin-Puu Jeng +4 more | 2023-12-26 |
| 11852672 | Test circuit and method | Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Chuan-Ching Wang, Hao Chen | 2023-12-26 |
| 11726112 | Electromagnetic shielding during wafer stage testing | Ching-Nen Peng, Hsien-Tang Wang, Chi-Chang Lai | 2023-08-15 |
| 11726122 | Antenna testing device and method for high frequency antennas | Chi-Chang Lai, Kai Tang | 2023-08-15 |
| 11693045 | Testing module and testing method using the same | Hao Chen | 2023-07-04 |
| 11631621 | Semiconductor device structure with magnetic element | Tang-Jung Chiu, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2023-04-18 |
| 11585846 | Testing module and testing method using the same | Hao Chen | 2023-02-21 |
| 11585831 | Test probing structure | Ching-Fang Chen, Sandeep Kumar Goel, Chung-Sheng Yuan, Chao-Yang Yeh, Chin-Chou Liu +2 more | 2023-02-21 |
| 11579190 | Testing holders for chip unit and die package | Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2023-02-14 |