Issued Patents 2023
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828790 | Circuit test structure and method of using | Hsiang-Tai Lu, Chih-Hsien Lin | 2023-11-28 |
| 11699683 | Semiconductor device in 3D stack with communication interface and managing method thereof | Igor Elkanovich, Amnon Parnass, Pei-Ling Yu, Li-Ken Yeh, Yung-Sheng Fang +3 more | 2023-07-11 |
| 11687472 | Interface for semiconductor device and interfacing method thereof | Igor Elkanovich, Amnon Parnass, Pei-Ling Yu, Li-Ken Yeh, Yung-Sheng Fang +3 more | 2023-06-27 |
| 11675731 | Data protection system and method thereof for 3D semiconductor device | Igor Elkanovich, Amnon Parnass, Pei-Ling Yu, Li-Ken Yeh, Yung-Sheng Fang +3 more | 2023-06-13 |
| 11646313 | Semiconductor and circuit structures, and related methods | Chang-Fen Hu, Shao-Yu Li, Kuo-Ji Chen, Chih-Peng Lin, Chuei-Tang Wang | 2023-05-09 |
| 11585831 | Test probing structure | Mill-Jer Wang, Sandeep Kumar Goel, Chung-Sheng Yuan, Chao-Yang Yeh, Chin-Chou Liu +2 more | 2023-02-21 |