Issued Patents 2023
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11837308 | Systems and methods to detect cell-internal defects | Ankita Patidar | 2023-12-05 |
| 11831781 | Device with self-authentication | Haohua Zhou | 2023-11-28 |
| 11727177 | Integrated circuit design method, system and computer program product | Ankita Patidar, Yun-Han Lee | 2023-08-15 |
| 11699010 | Method and system for reducing migration errors | Ankita Patidar, Yun-Han Lee | 2023-07-11 |
| 11663387 | Fault diagnostics | Ankita Patidar | 2023-05-30 |
| 11585831 | Test probing structure | Mill-Jer Wang, Ching-Fang Chen, Chung-Sheng Yuan, Chao-Yang Yeh, Chin-Chou Liu +2 more | 2023-02-21 |
| 11549984 | Scan architecture for interconnect testing in 3D integrated circuits | Yun-Han Lee, Saman M. I. Adham, Marat Gershoig | 2023-01-10 |