Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11823758 | Conducting built-in self-test of memory macro | Saman M. I. Adham, Ted Wong, Vineet Joshi | 2023-11-21 |
| 11549984 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Saman M. I. Adham | 2023-01-10 |