Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821942 | Apparatus and method for probing device-under-test | Chuan-Hsiang Sun, Bo-You Chen, Hsiou-Yu He, Peiwei Lin | 2023-11-21 |
| 11726112 | Electromagnetic shielding during wafer stage testing | Ching-Nen Peng, Hsien-Tang Wang, Mill-Jer Wang | 2023-08-15 |
| 11726122 | Antenna testing device and method for high frequency antennas | Kai Tang, Mill-Jer Wang | 2023-08-15 |
| 11631621 | Semiconductor device structure with magnetic element | Mill-Jer Wang, Tang-Jung Chiu, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2023-04-18 |