Issued Patents 2021
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11158509 | Pattern fidelity enhancement with directional patterning technology | Yu-Tien Shen, Chi-Cheng Hung, Chin-Hsiang Lin, Chien-Wei Wang, Ching-Yu Chang +7 more | 2021-10-26 |
| 11094556 | Method of manufacturing semiconductor devices using directional process | Ya-Wen Yeh, Yu-Tien Shen, Shih-Chun Huang, Po-Chin Chang, Wei-Liang Lin +4 more | 2021-08-17 |
| 11088030 | Semiconductor device and a method for fabricating the same | Jui-Yao Lai, Ru-Gun Liu, Sai-Hooi Yeong, Yen-Ming Chen, Ying-Yan Chen | 2021-08-10 |
| 11075079 | Directional deposition for semiconductor fabrication | Shih-Chun Huang, Ya-Wen Yeh, Chien-Wen Lai, Wei-Liang Lin, Ya Hui Chang +3 more | 2021-07-27 |
| 11024579 | Dual power structure with connection pins | Shih-Wei Peng, Chih-Ming Lai, Chun-Kuang Chen, Chih-Liang Chen, Charles Chew-Yuen Young +3 more | 2021-06-01 |
| 11004729 | Method of manufacturing semiconductor devices | Ru-Gun Liu, Chin-Hsiang Lin, Chih-Ming Lai, Wei-Liang Lin | 2021-05-11 |
| 10991657 | Method for fabricating semiconductor device | Chiu-Hsiang Chen, Shih-Chun Huang, Ru-Gun Liu | 2021-04-27 |
| 10991583 | Self aligned litho etch process patterning method | Chih-Min HSIAO, Chien-Wen Lai, Shih-Chun Huang, Chih-Ming Lai, Ru-Gun Liu | 2021-04-27 |
| 10962892 | Lithography process monitoring method | Chih-Jie Lee, Shih-Chun Huang, Shih-Ming Chang, Ken-Hsien Hsieh, Ru-Gun Liu | 2021-03-30 |
| 10957551 | Fin-like field effect transistor patterning methods for increasing process margins | Chin-Yuan Tseng, Wei-Liang Lin, Hsin-Chih Chen, Shi Ning Ju, Ken-Hsien Hsieh +1 more | 2021-03-23 |
| 10916475 | Semiconductor device and a method for fabricating the same | Jui-Yao Lai, Ying-Yan Chen, Yen-Ming Chen, Sai-Hooi Yeong, Ru-Gun Liu | 2021-02-09 |