Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
HC

Hsueh-Chung Chen

IBM: 15 patents #229 of 11,638Top 2%
Cohoes, NY: #2 of 25 inventorsTop 8%
New York: #150 of 12,766 inventorsTop 2%
Overall (2021): #3,635 of 548,734Top 1%
15 Patents 2021

Issued Patents 2021

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
11171001 Multiple patterning scheme integration with planarized cut patterning Yongan Xu, Lawrence A. Clevenger, Yann Mignot, Cornelius Brown Peethala 2021-11-09
11164778 Barrier-free vertical interconnect structure Junli Wang, Su Chen Fan, Yann Mignot, Lawrence A. Clevenger 2021-11-02
11152298 Metal via structure Yann Mignot, James J. Kelly, Muthumanickam Sankarapandian, Yongan Xu, Daniel J. Vincent 2021-10-19
11133216 Interconnect structure Roger A. Quon, Chih-Chao Yang 2021-09-28
11107727 Double metal double patterning with vias extending into dielectric Yann Mignot 2021-08-31
11094527 Wet clean solutions to prevent pattern collapse Cornelius Brown Peethala, Chih-Chao Yang, Raghuveer R. Patlolla 2021-08-17
11087993 Double replacement metal line patterning Ruilong Xie, Chih-Chao Yang, Kangguo Cheng 2021-08-10
11075161 Large via buffer Yann Mignot, Junli Wang, Chi-Chun Liu, Mary Claire Silvestre 2021-07-27
11069564 Double metal patterning Yongan Xu, Yann Mignot, James J. Kelly, Lawrence A. Clevenger 2021-07-20
11063126 Metal contact isolation for semiconductor structures Su Chen Fan, Yann Mignot, James J. Kelly 2021-07-13
11056426 Metallization interconnect structure formation Yann Mignot, Hosadurga Shobha, Chih-Chao Yang 2021-07-06
11024551 Metal replacement vertical interconnections for buried capacitance Lawrence A. Clevenger, Daniel James Dechene, Somnath Ghosh, Carl Radens 2021-06-01
11004736 Integrated circuit having a single damascene wiring network Junli Wang, Somnath Ghosh, Chih-Chao Yang, Lawrence A. Clevenger 2021-05-11
10971356 Stack viabar structures Su Chen Fan, Yann Mignot, James J. Kelly, Terence B. Hook 2021-04-06
10937653 Multiple patterning scheme integration with planarized cut patterning Yongan Xu, Lawrence A. Clevenger, Yann Mignot, Cornelius Brown Peethala 2021-03-02