PH

Pouya Hashemi

IBM: 120 patents #4 of 10,852Top 1%
Globalfoundries: 3 patents #173 of 1,311Top 15%
📍 Purchase, NY: #1 of 9 inventorsTop 15%
🗺 New York: #4 of 12,278 inventorsTop 1%
Overall (2017): #19 of 506,227Top 1%
123
Patents 2017

Issued Patents 2017

Showing 76–100 of 123 patents

Patent #TitleCo-InventorsDate
9659823 Highly scaled tunnel FET with tight pitch and method to fabricate same Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-23
9653362 Complementary heterogeneous MOSFET using global SiGe substrate and hard-mask memorized germanium dilution for nFET Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-16
9653582 Forming a Fin using double trench epitaxy Veeraraghavan S. Basker, Shogo Mochizuki, Alexander Reznicek 2017-05-16
9653580 Semiconductor device including strained finFET Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-16
9653465 Vertical transistors having different gate lengths Karthik Balakrishnan, Tak H. Ning, Alexander Reznicek 2017-05-16
9653289 Fabrication of nano-sheet transistors with different threshold voltages Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-16
9647112 Fabrication of strained vertical P-type field effect transistors by bottom condensation Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-09
9647123 Self-aligned sigma extension regions for vertical transistors Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-09
9647113 Strained FinFET by epitaxial stressor independent of gate pitch Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek, Charan V. Surisetty 2017-05-09
9640667 III-V vertical field effect transistors with tunable bandgap source/drain regions Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-05-02
9633912 Complementary heterogeneous MOSFET using global SiGe substrate and hard-mask memorized germanium dilution for nFET Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-25
9634142 Method for improving boron diffusion in a germanium-rich fin through germanium concentration reduction in fin S/D regions by thermal mixing Dominic J. Schepis, Alexander Reznicek, Kangguo Cheng 2017-04-25
9633943 Method and structure for forming on-chip anti-fuse with reduced breakdown voltage Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2017-04-25
9633908 Method for forming a semiconductor structure containing high mobility semiconductor channel materials Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2017-04-25
9627381 Confined N-well for SiGe strain relaxed buffer structures Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-18
9627536 Field effect transistors with strained channel features Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-18
9627491 Aspect ratio trapping and lattice engineering for III/V semiconductors Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2017-04-18
9627270 Dual work function integration for stacked FinFET Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2017-04-18
9627267 Integrated circuit having strained fins on bulk substrate and method to fabricate same Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-18
9613873 Nanowire semiconductor device Karthik Balakrishnan, Sanghoon Lee 2017-04-04
9614040 Strained silicon germanium fin with block source/drain epitaxy and improved overlay capacitance Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-04
9614037 Nano-ribbon channel transistor with back-bias control Karthik Balakrishnan, Kangguo Cheng, Alexander Reznicek 2017-04-04
9607990 Method to form strained nFET and strained pFET nanowires on a same substrate Kangguo Cheng, Ali Khakifirooz, Alexander Reznicek 2017-03-28
9608068 Substrate with strained and relaxed silicon regions Kangguo Cheng, Bruce B. Doris, Hong He, Alexander Reznicek 2017-03-28
9608066 High-K spacer for extension-free CMOS devices with high mobility channel materials Takashi Ando, Vijay Narayanan, Yanning Sun 2017-03-28