| 9490154 |
Method of aligning substrate-scale mask with substrate |
Abraham Ravid, Paul Connors, Sergey Starik, Ganesh Balasubramanian |
2016-11-08 |
| 9458537 |
PECVD process |
Nagarajan Rajagopalan, Xinhai Han, Michael Wenyoung Tsiang, Masaki Ogata, Zhijun Jiang +17 more |
2016-10-04 |
| 9443714 |
Methods and apparatus for substrate edge cleaning |
James M. Holden, Song-Moon Suh, Kalyanjit Ghosh, Leon Volfovski, Michael R. Rice +1 more |
2016-09-13 |
| 9429247 |
Acoustically-monitored semiconductor substrate processing systems and methods |
Kommisetti Subrahmanyam, Joseph Yudovsky, Michael W. Johnson |
2016-08-30 |
| 9405287 |
Apparatus and method for optical calibration of wafer placement by a robot |
Abraham Ravid, Eran Weiss, Michael R. Rice, Izya Kremerman |
2016-08-02 |
| 9335151 |
Film measurement |
Edward W. Budiarto, Dmitry A. Dzilno |
2016-05-10 |
| 9252057 |
Laser and plasma etch wafer dicing with partial pre-curing of UV release dicing tape for film frame wafer application |
Mohammad Kamruzzaman Chowdhury, Wei-Sheng Lei, Brad Eaton, Madhava Rao Yalamanchili, Ajay Kumar |
2016-02-02 |