Peter De Groot — 126 Patents at Zygo

Peter De Groot has been granted 126 US patents while listed as an inventor at Zygo. The first was granted in 1990 and the most recent in October 2024. Peter De Groot ranks #8,987 of 4,157,543 US inventors in our database (top 0.22%). Patent records list Peter De Groot in Middletown, CT, US.

Issued Patents All Time

Showing 1–25 of 126 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12104897	Interometric optical system	—	2024-10-01
10591284	Metrology of multi-layer stacks	Leslie L. Deck	2020-03-17
10451413	Surface topography apparatus and method	Leslie L. Deck	2019-10-22
9958254	Calibration of scanning interferometers	Jake Beverage, Xavier Colonna de Lega, Martin F. Fay	2018-05-01
9798130	Measuring topography of aspheric and other non-flat surfaces	Thomas Dresel, Jan Liesener	2017-10-24
9746348	Double pass interferometric encoder system	Jan Liesener	2017-08-29
9658129	Method and system for determining information about a transparent optical element comprising a lens portion and a plane parallel portion	Xavier Colonna de Lega, Martin F. Fay	2017-05-23
9599534	Optical evaluation of lenses and lens molds	Martin F. Fay, Xavier Colonna de Lega	2017-03-21
9377292	Interferometry employing refractive index dispersion broadening of interference signals	—	2016-06-28
9140537	Interferometric heterodyne optical encoder system	Michael D. Schroeder	2015-09-22
9025162	Interferometry for lateral metrology	Xavier Colonna de Lega, Robert Stoner	2015-05-05
9025161	Double pass interferometric encoder system	Jan Liesener	2015-05-05
8988690	Interferometric encoder systems	Leslie L. Deck, Michael D. Schroeder	2015-03-24
8902431	Low coherence interferometry with scan error correction	Jan Liesener, Mark Davidson, Xavier Colonna de Lega, Leslie L. Deck	2014-12-02
8885172	Interferometric heterodyne optical encoder system	Michael D. Schroeder	2014-11-11
8854628	Interferometric methods for metrology of surfaces, films and underresolved structures	Xavier Colonna de Lega, Jan Liesener	2014-10-07
8780334	Topographical profiling with coherence scanning interferometry	—	2014-07-15
8670127	Interferometric encoder systems	Leslie L. Deck, Michael D. Schroeder	2014-03-11	$2,257,000
8379218	Fiber-based interferometer system for monitoring an imaging interferometer	Leslie L. Deck, Mark Davidson, Jan Liesener, Xavier Colonna De Lega	2013-02-19	$2,127,000
8300233	Interferometric encoder systems	Leslie L. Deck, Michael D. Schroeder	2012-10-30
8248617	Interferometer for overlay measurements	Jan Liesener, Xavier Colonna De Lega	2012-08-21	$3,760,000
8189202	Interferometer for determining overlay errors	Jan Liesener, Xavier Colonna De Lega	2012-05-29	$3,751,000
8126677	Analyzing surface structure using scanning interferometry	Xavier Colonna De Lega	2012-02-28	$2,305,000
8120781	Interferometric systems and methods featuring spectral analysis of unevenly sampled data	Jan Liesener, Mark Davidson, Xavier Colonna de Lega, Leslie L. Deck	2012-02-21	$4,602,000
8107085	Methods and systems for interferometric analysis of surfaces and related applications	—	2012-01-31	$2,320,000

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Peter De Groot — 126 Patents

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