Mark Davidson — 16 Patents at Zygo

Mark Davidson has been granted 16 US patents while listed as an inventor at Zygo. The first was granted in 1989 and the most recent in December 2014. Mark Davidson ranks #284,196 of 4,157,543 US inventors in our database (top 6.8%). Patent records list Mark Davidson in Palo Alto, CA, US.

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8902431	Low coherence interferometry with scan error correction	Jan Liesener, Peter De Groot, Xavier Colonna de Lega, Leslie L. Deck	2014-12-02
8379218	Fiber-based interferometer system for monitoring an imaging interferometer	Leslie L. Deck, Peter De Groot, Jan Liesener, Xavier Colonna De Lega	2013-02-19	$2,127,000
8120781	Interferometric systems and methods featuring spectral analysis of unevenly sampled data	Jan Liesener, Peter De Groot, Xavier Colonna de Lega, Leslie L. Deck	2012-02-21	$4,602,000
8107084	Interference microscope with scan motion detection using fringe motion in monitor patterns	—	2012-01-31	$2,320,000
8004688	Scan error correction in low coherence scanning interferometry	Jan Liesener, Peter De Groot, Xavier Colonna de Lega, Leslie L. Deck	2011-08-23	$2,557,000
7978338	Compound reference interferometer	Peter De Groot, Jan Liesener, Xavier Colonna De Lega, Leslie L. Deck	2011-07-12	$1,373,000
7115881	Positioning and motion control by electrons, ions, and neutrals in electric fields	Mario Rabinowitz	2006-10-03
7061623	Interferometric back focal plane scatterometry with Koehler illumination	—	2006-06-13
7054071	Mireau interference objective lens	—	2006-05-30
6843573	Mini-optics solar energy concentrator	Mario Rabinowitz	2005-01-18
6738176	Dynamic multi-wavelength switching ensemble	Mario Rabinowitz	2004-05-18
6698693	Solar propulsion assist	Mario Rabinowitz	2004-03-02
6612705	Mini-optics solar energy concentrator	Mario Rabinowitz	2003-09-02
5282088	Aplanatic microlens and method for making same	—	1994-01-25
5112129	Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology	Kalman Kaufman, Isaac Mazor	1992-05-12	$2,167,000
4818110	Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like	—	1989-04-04	$2,092,000

Mark Davidson — 16 Patents

Issued Patents All Time

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