Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9958254 | Calibration of scanning interferometers | Peter De Groot, Jake Beverage, Martin F. Fay | 2018-05-01 |
| 9719777 | Interferometer with real-time fringe-free imaging | Jan Liesener | 2017-08-01 |
| 9658129 | Method and system for determining information about a transparent optical element comprising a lens portion and a plane parallel portion | Martin F. Fay, Peter De Groot | 2017-05-23 |
| 9599534 | Optical evaluation of lenses and lens molds | Martin F. Fay, Peter De Groot | 2017-03-21 |
| 9541381 | Surface topography interferometer with surface color | — | 2017-01-10 |
| 9025162 | Interferometry for lateral metrology | Robert Stoner, Peter De Groot | 2015-05-05 |
| 8902431 | Low coherence interferometry with scan error correction | Jan Liesener, Mark Davidson, Peter De Groot, Leslie L. Deck | 2014-12-02 |
| 8854628 | Interferometric methods for metrology of surfaces, films and underresolved structures | Peter De Groot, Jan Liesener | 2014-10-07 |
| 8698891 | Object thickness and surface profile measurements | Justin Turner, Tyler Steele, Stephen L. Mielke, Bruce E. Truax, Andrew D. Meigs | 2014-04-15 |
| 8649024 | Non-contact surface characterization using modulated illumination | — | 2014-02-11 |
| 8120781 | Interferometric systems and methods featuring spectral analysis of unevenly sampled data | Jan Liesener, Mark Davidson, Peter De Groot, Leslie L. Deck | 2012-02-21 |
| 8004688 | Scan error correction in low coherence scanning interferometry | Mark Davidson, Jan Liesener, Peter De Groot, Leslie L. Deck | 2011-08-23 |
| 7924435 | Apparatus and method for measuring characteristics of surface features | Peter De Groot | 2011-04-12 |
| 7468799 | Scanning interferometry for thin film thickness and surface measurements | Peter De Groot | 2008-12-23 |