Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9798130 | Measuring topography of aspheric and other non-flat surfaces | Jan Liesener, Peter De Groot | 2017-10-24 |
| 9435640 | Interferometer and method for measuring non-rotationally symmetric surface topography having unequal curvatures in two perpendicular principal meridians | — | 2016-09-06 |
| 7495773 | In situ determination of pixel mapping in interferometry | — | 2009-02-24 |