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Inspection method for memory integrity, nonvolatile memory and electronic device |
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Memory device and program/erase method therefor |
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Flash memory storage device and operating method thereof |
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Multi-zone temperature control for semiconductor wafer |
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Dummy structure for chip-on-wafer-on-substrate |
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Dummy structure for chip-on-wafer-on-substrate |
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Storage medium and accessing system utilizing the same |
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Memory cell structure and formation method thereof |
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Flash memory apparatus and data reading method thereof |
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Flash memory apparatus with serial interface and reset method thereof |
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Multi-zone temperature control for semiconductor wafer |
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Flash memory apparatus with serial interface and reset method thereof |
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Flash memory and layout method thereof |
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Method of fabricating a sealing structure for high-k metal gate |
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Multi-zone temperature control for semiconductor wafer |
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Sealing structure for high-K metal gate |
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Device and method for compensating defect in semiconductor memory |
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2007-04-10 |
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Device and method for compensating defect in semiconductor memory |
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2006-03-28 |
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Voltage sensing circuit |
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1999-01-19 |
