SG

Sandeep Kumar Goel

TL Tsmc Nanjing Company, Limited: 9 patents #9 of 113Top 8%
LS Lsi: 4 patents #338 of 1,740Top 20%
NB Nxp B.V.: 3 patents #771 of 3,591Top 25%
Philips: 1 patents #3,761 of 7,731Top 50%
🗺 California: #1,951 of 386,348 inventorsTop 1%
Overall (All Time): #12,545 of 4,157,543Top 1%
107
Patents All Time

Issued Patents All Time

Showing 26–50 of 107 patents

Patent #TitleCo-InventorsDate
11354465 Function safety and fault management modeling at electrical system level (ESL) Kai-Yuan Ting, Yun-Han Lee, Mei Hsu Wong, Hsin-Cheng Chen 2022-06-07
11343433 Image processing apparatus having overlapping sub-regions Yun-Han Lee, Ashok Mehta 2022-05-24
11295831 Systems and methods to detect cell-internal defects Ankita Patidar 2022-04-05
11231767 Dynamic frequency scaling Kai-Yuan Ting, Ashok Mehta, Stanley John 2022-01-25
11163351 Power estimation Kai-Yuan Ting, Shereef Shehata, Tze-Chiang Huang, Mei Hsu Wong, Yun-Han Lee 2021-11-02
11113444 Machine-learning based scan design enablement platform Yun-Han Lee, Vinay Kotha, Ankita Patidar 2021-09-07
11068633 Fault diagnostics Ankita Patidar 2021-07-20
11055455 Method and system for reducing migration errors Yun-Han Lee, Ankita Patidar 2021-07-06
11025261 Phase-locked loop monitor circuit Ji-Jan Chen, Stanley John, Yun-Han Lee, Yen-Hao Huang 2021-06-01
10985922 Device with self-authentication Haohua Zhou 2021-04-20
10871518 Systems and methods for determining systematic defects Yun-Han Lee, Ankita Patidar 2020-12-22
10867098 System and method for ESL modeling of machine learning Kai-Yuan Ting, Tze-Chiang Huang, Yun-Han Lee 2020-12-15
10867089 Electrical system level (ESL) battery discharge simulation Charlie Zhou, Kai-Yuan Ting, Tze-Chiang Huang, Yun-Han Lee 2020-12-15
10782318 Test probing structure Mill-Jer Wang, Ching-Fang Chen, Chung-Sheng Yuan, Chao-Yang Yeh, Chin-Chou Liu +2 more 2020-09-22
10776538 Function safety and fault management modeling at electrical system level (ESL) Kai-Yuan Ting, Yun-Han Lee, Mei Hsu Wong, Hsin-Cheng Chen 2020-09-15
10719648 System and method for system-level parameter estimation Tze-Chiang Huang, Kai-Yuan Ting, Yun-Han Lee, Shereef Shehata, Mei Hsu Wong 2020-07-21
10685157 Power-aware scan partitioning Ankita Patidar, Yun-Han Lee 2020-06-16
10680627 Phase-locked loop monitor circuit Ji-Jan Chen, Stanley John, Yun-Han Lee, Yen-Hao Huang 2020-06-09
10666578 Network-on-chip system and a method of generating the same Ravi Venugopalan, Yun-Han Lee 2020-05-26
10539617 Scan architecture for interconnect testing in 3D integrated circuits Yun-Han Lee, Saman M. I. Adham, Marat Gershoig 2020-01-21
10440281 Image processing apparatus on integrated circuit and method thereof Yun-Han Lee, Ashok Mehta 2019-10-08
10371751 Circuit and method for diagnosing scan chain failures 2019-08-06
10345883 Power estimation Kai-Yuan Ting, Shereef Shehata, Tze-Chiang Huang, Mei Hsu Wong, Yun-Han Lee 2019-07-09
10267857 Method and system for functional safety verification Abhishek Koneru, Tri Ngo, Yun-Han Lee 2019-04-23
10256828 Phase-locked loop monitor circuit Ji-Jan Chen, Stanley John, Yun-Han Lee, Yen-Hao Huang 2019-04-09