Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11411571 | Phase-locked loop monitor circuit | Sandeep Kumar Goel, Stanley John, Yun-Han Lee, Yen-Hao Huang | 2022-08-09 |
| 11025261 | Phase-locked loop monitor circuit | Sandeep Kumar Goel, Stanley John, Yun-Han Lee, Yen-Hao Huang | 2021-06-01 |
| 10680627 | Phase-locked loop monitor circuit | Sandeep Kumar Goel, Stanley John, Yun-Han Lee, Yen-Hao Huang | 2020-06-09 |
| 10256828 | Phase-locked loop monitor circuit | Sandeep Kumar Goel, Stanley John, Yun-Han Lee, Yen-Hao Huang | 2019-04-09 |
| 10156609 | Device and method for robustness verification | Sandeep Kumar Goel, Stanley John, Yun-Han Lee | 2018-12-18 |
| 9847318 | Monolithic stacked integrated circuits with a redundant layer for repairing defects | Kuan-Yu Lin, Chin-Her Chien, Jung-Rung Jiang, Wei-Pin Changchien | 2017-12-19 |
| 9766286 | Defect diagnosis | Kuen-Jong Lee, Cheng-Hung Wu, Wei-Cheng Lien, Hui-Ling Lin, Yen-Ling Liu | 2017-09-19 |
| 9310431 | Diagnosis framework to shorten yield learning cycles of advanced processes | Yen-Ling Liu, Nan-Hsin Tseng, Wei-Pin Changchien, Samuel C. Pan | 2016-04-12 |
| 9269640 | Repairing monolithic stacked integrated circuits with a redundant layer and lithography process | Kuan-Yu Lin, Jung-Rung Jiang, Chin-Her Chien, Wei-Pin Changchien | 2016-02-23 |
| 8863062 | Methods and apparatus for floorplanning and routing co-design | Yi-Lin Chuang, Ching-Fang Chen, Yun-Han Lee | 2014-10-14 |
| 8832511 | Built-in self-test for interposer | Nan-Hsin Tseng, Chin-Chou Liu | 2014-09-09 |
| 8707238 | Method to determine optimal micro-bump-probe pad pairing for efficient PGD testing in interposer designs | Yi-Lin Chuang, Cheng-Pin Chiu, Ching-Fang Chen, Sandeep Kumar Goel, Yun-Han Lee +1 more | 2014-04-22 |
| 8614571 | Apparatus and method for on-chip sampling of dynamic IR voltage drop | Nan-Hsin Tseng, Chin-Chou Liu, Saurabh Gupta, Chi Wei Hu | 2013-12-24 |
| 8384455 | Apparatus for clock skew compensation | Yu-Lin Lee, Nai-Chen Cheng, Yuan-Hua Chu, Ching-Yuan Yang | 2013-02-26 |
| 8144756 | Jitter measuring system and method | Yu-Lin Lee, Nai-Chen Cheng | 2012-03-27 |
| 8113412 | Methods for detecting defect connections between metal bumps | Nan-Hsin Tseng, Yun-Han Lee, Chin-Chou Liu, Wei-Pin Changchien, Chien-Hui Chen | 2012-02-14 |
| 8051394 | Yield evaluating apparatus and method thereof | Pei-Wen Luo, Jwu-E Chen, Chin-Long Wey, Liang-Chia Cheng, Wen-Ching Wu | 2011-11-01 |