NT

Nan-Hsin Tseng

TSMC: 20 patents #1,647 of 12,232Top 15%
📍 Tainan, TW: #301 of 4,566 inventorsTop 7%
Overall (All Time): #220,346 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11283402 Device and method of operating the same Ping-Han Tsai, Chih-Sheng Hou, Po-Yu Chen 2022-03-22
10868494 Device and method of operating the same Ping-Han Tsai, Chih-Sheng Hou, Po-Yu Chen 2020-12-15
10277206 Integrated circuit with an oscillating signal-generating assembly Ping-Han Tsai, Po-Yu Chen, Wei-Hao Kao 2019-04-30
9714979 Contactless signal testing Bo-Jr Huang, Yen-Ling Liu 2017-07-25
9478469 Integrated circuit comprising buffer chain Yi-Lin Chuang, Chien-Hui Chen, Wei-Pin Changchien, Chin-Her Chien 2016-10-25
9423452 Contactless signal testing Bo-Jr Huang, Yen-Ling Liu 2016-08-23
9310431 Diagnosis framework to shorten yield learning cycles of advanced processes Yen-Ling Liu, Ji-Jan Chen, Wei-Pin Changchien, Samuel C. Pan 2016-04-12
9269537 E-beam lithography with alignment gating Ramakrishnan Krishnan 2016-02-23
9117796 Semiconductor arrangement and formation thereof Bo-Jr Huang, Ping-Han Tsai, Wei-Hao Kao 2015-08-25
9059685 Circuit and method for pulse width measurement Ramakrishnan Krishnan 2015-06-16
8981842 Integrated circuit comprising buffer chain Yi-Lin Chuang, Chien-Hui Chen, Wei-Pin Changchien, Chin-Her Chien 2015-03-17
8937512 Voltage-controlled oscillator Bo-Jr Huang, Wei-Hao Kao, Ping-Han Tsai, Wei-Pin Changchien 2015-01-20
8832511 Built-in self-test for interposer Ji-Jan Chen, Chin-Chou Liu 2014-09-09
8680882 3D-IC interposer testing structure and method of testing the structure Chi-Yeh Yu 2014-03-25
8614571 Apparatus and method for on-chip sampling of dynamic IR voltage drop Chin-Chou Liu, Saurabh Gupta, Ji-Jan Chen, Chi Wei Hu 2013-12-24
8384430 RC delay detectors with high sensitivity for through substrate vias Chin-Chou Liu, Wei-Pin Changchien, Pei-Ying Lin, Ta-Wen Hung 2013-02-26
8339155 System and method for detecting soft-fails Chin-Chou Liu, Wei-Pin Changchien, Kin Lam Tong 2012-12-25
8305847 Ultra high resolution timing measurement Chin-Chou Liu, Saurabh Gupta 2012-11-06
8113412 Methods for detecting defect connections between metal bumps Yun-Han Lee, Chin-Chou Liu, Ji-Jan Chen, Wei-Pin Changchien, Chien-Hui Chen 2012-02-14
7986591 Ultra high resolution timing measurement Chin-Chou Liu, Saurabh Gupta 2011-07-26