Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11017149 | Machine-learning design enablement platform | Yi-Lin Chuang, Ching-Fang Chen, Wei-Li Chen, Yung-Chin Hou, Yun-Han Lee | 2021-05-25 |
| 10866281 | System and method to diagnose integrated circuit | Hong-Chen Cheng, Pei-Ying Lin, Hsin-Wu Hsu | 2020-12-15 |
| 10678973 | Machine-learning design enablement platform | Yi-Lin Chuang, Ching-Fang Chen, Wei-Li Chen, Yung-Chin Hou, Yun-Han Lee | 2020-06-09 |
| 10267853 | System and method to diagnose integrated circuit | Hong-Chen Cheng, Pei-Ying Lin, Hsin-Wu Hsu | 2019-04-23 |
| 9847318 | Monolithic stacked integrated circuits with a redundant layer for repairing defects | Kuan-Yu Lin, Chin-Her Chien, Ji-Jan Chen, Jung-Rung Jiang | 2017-12-19 |
| 9601478 | Oxide definition (OD) gradient reduced semiconductor device | Yi-Lin Chuang, Chun-Cheng Ku, Chin-Her Chien | 2017-03-21 |
| 9478469 | Integrated circuit comprising buffer chain | Yi-Lin Chuang, Chien-Hui Chen, Chin-Her Chien, Nan-Hsin Tseng | 2016-10-25 |
| 9310431 | Diagnosis framework to shorten yield learning cycles of advanced processes | Yen-Ling Liu, Nan-Hsin Tseng, Ji-Jan Chen, Samuel C. Pan | 2016-04-12 |
| 9286431 | Oxide definition (OD) gradient reduced semiconductor device and method of making | Yi-Lin Chuang, Chun-Cheng Ku, Chin-Her Chien | 2016-03-15 |
| 9269640 | Repairing monolithic stacked integrated circuits with a redundant layer and lithography process | Kuan-Yu Lin, Jung-Rung Jiang, Chin-Her Chien, Ji-Jan Chen | 2016-02-23 |
| 9097762 | Method and apparatus for diagnosing an integrated circuit | Kin Lam Tong, Chin-Chou Liu | 2015-08-04 |
| 8981842 | Integrated circuit comprising buffer chain | Yi-Lin Chuang, Chien-Hui Chen, Chin-Her Chien, Nan-Hsin Tseng | 2015-03-17 |
| 8937512 | Voltage-controlled oscillator | Bo-Jr Huang, Nan-Hsin Tseng, Wei-Hao Kao, Ping-Han Tsai | 2015-01-20 |
| 8701070 | Group bounding box region-constrained placement for integrated circuit design | Yi-Lin Chuang, Chun-Cheng Ku, Yun-Han Lee, Shao-Yu Wang, Chin-Chou Liu | 2014-04-15 |
| 8566766 | Method for detecting small delay defects | Sandeep Kumar Goel, Saurabh Gupta, Chin-Chou Liu | 2013-10-22 |
| 8384430 | RC delay detectors with high sensitivity for through substrate vias | Nan-Hsin Tseng, Chin-Chou Liu, Pei-Ying Lin, Ta-Wen Hung | 2013-02-26 |
| 8347132 | System and method for reducing processor power consumption | Lee-Chung Lu, Chung-Hsing Wang, Myron Shak, Kuo-Yin Chen, Chi Wei Hu +2 more | 2013-01-01 |
| 8339155 | System and method for detecting soft-fails | Nan-Hsin Tseng, Chin-Chou Liu, Kin Lam Tong | 2012-12-25 |
| 8258883 | System and method for characterizing process variations | Yi-Wei Chen, Chi Wei Hu, Chin-Chou Liu | 2012-09-04 |
| 8113412 | Methods for detecting defect connections between metal bumps | Nan-Hsin Tseng, Yun-Han Lee, Chin-Chou Liu, Ji-Jan Chen, Chien-Hui Chen | 2012-02-14 |