Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324129 | Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains | Ping TANG | 2019-06-18 |
| 10324130 | Test decompressor and test method thereof | Jhen-Zong Chen | 2019-06-18 |
| 9857240 | System and method for temperature sensing of three-dimensional integrated circuit | Soon-Jyh Chang, Peng Chen, Chung-Ho Chen | 2018-01-02 |
| 9766286 | Defect diagnosis | Cheng-Hung Wu, Wei-Cheng Lien, Hui-Ling Lin, Yen-Ling Liu, Ji-Jan Chen | 2017-09-19 |
| 9448122 | Multi-point temperature sensing method for integrated circuit chip and system of the same | Soon-Jyh Chang, Guan-Ying Huang, Wen-Yu Su, Chung-Ho Chen, Lih-Yih Chiou +3 more | 2016-09-20 |
| 8892973 | Debugging control system using inside core event as trigger condition and method of the same | Jia-Wei Jhou | 2014-11-18 |
| 7571414 | Multi-project system-on-chip and its method | Chun-Ming Huang, Chih-Chyau Yang, Jing-Yang Jou, Lan-Da Van | 2009-08-04 |
| 7159161 | Test method and architecture for circuits having inputs | Jih-Jeen Chen, Cheng Huang | 2007-01-02 |
| 6360342 | Built-in self test for multiple memories in a chip | Jing Wu, Wen-Ben Jone | 2002-03-19 |
| 5808476 | Built-in current sensor for IDDQ monitoring | Jing-Jou Tang | 1998-09-15 |
| 5631575 | Intermediate voltage sensor for CMOS circuits | Jing-Jou Tang | 1997-05-20 |