Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7005873 | Built-in self-test hierarchy for an integrated circuit | Llyoung Kim, Laurence Reeves, Paul W. Rutkowski | 2006-02-28 |
| 6360342 | Built-in self test for multiple memories in a chip | Kuen-Jong Lee, Wen-Ben Jone | 2002-03-19 |