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Built-in self-test hierarchy for an integrated circuit |
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2006-02-28 |
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Built-in self-test controlled by a token network and method |
Ilyoung Kim, Yervant Zorian |
2001-05-22 |
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Built-in self-test in a plurality of stages controlled by a token passing network and method |
Ilyoung Kim, Yervant Zorian |
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Method and apparatus for partial-scan testing of a device using its boundary-scan port |
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1997-04-22 |
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Boundary scan cell |
William E. Feger |
1996-02-06 |
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Pseudo-exhaustive self-test technique |
John A. Malleo-Roach, Eleanor Wu |
1995-10-10 |
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Pseudo-exhaustive self-test technique |
John A. Malleo-Roach, Eleanor Wu |
1993-02-16 |
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Method and apparatus for generating control signals |
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1991-09-10 |