Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7005873 | Built-in self-test hierarchy for an integrated circuit | Llyoung Kim, Laurence Reeves, Jing Wu | 2006-02-28 |
| 6237123 | Built-in self-test controlled by a token network and method | Ilyoung Kim, Yervant Zorian | 2001-05-22 |
| 5978947 | Built-in self-test in a plurality of stages controlled by a token passing network and method | Ilyoung Kim, Yervant Zorian | 1999-11-02 |
| 5623503 | Method and apparatus for partial-scan testing of a device using its boundary-scan port | — | 1997-04-22 |
| 5490151 | Boundary scan cell | William E. Feger | 1996-02-06 |
| 5457697 | Pseudo-exhaustive self-test technique | John A. Malleo-Roach, Eleanor Wu | 1995-10-10 |
| 5187712 | Pseudo-exhaustive self-test technique | John A. Malleo-Roach, Eleanor Wu | 1993-02-16 |
| 5048021 | Method and apparatus for generating control signals | Najmi T. Jarwala, Chi W. Yau | 1991-09-10 |