| 12360221 |
Electronic device and method for compensating for depth error according to modulation frequency |
Johngy LEE, Hojong Kim, Jaeyoung Huh |
2025-07-15 |
| 11852752 |
Cross-talk prevention structure of electronic device for measuring distance to external object |
Hyunju Yang, Kihuk LEE |
2023-12-26 |
| 11445098 |
Camera assembly and electronic device including same |
Wonjun JEONG, Moonkyeong Kim, Junyoung Kim, Jaeyoung Huh |
2022-09-13 |
| 11216070 |
Electronic device and method for controlling actuator by utilizing same |
Yudong BAE, Jeongseok Lee, Jaeyoung Huh, Donggyu Kim, Kwonho SONG +1 more |
2022-01-04 |
| 8201032 |
Generalized BIST for multiport memories |
Donald Albert Evans |
2012-06-12 |
| 7254763 |
Built-in self test for memory arrays using error correction coding |
Duane Rodney Aadsen, Ross A. Kohler, Richard J. McPartland |
2007-08-07 |
| 6397349 |
Built-in self-test and self-repair methods and devices for computer memories comprising a reconfiguration memory device |
Frank Higgins, Goh Komoriya, Hai Quang Pham, Yervant Zorian |
2002-05-28 |
| 6317846 |
System and method for detecting faults in computer memories using a look up table |
Frank Higgins, Yervant Zorian |
2001-11-13 |
| 6237123 |
Built-in self-test controlled by a token network and method |
Paul W. Rutkowski, Yervant Zorian |
2001-05-22 |
| 6216241 |
Method and system for testing multiport memories |
Larry R. Fenstermaker, Frank Higgins, James L. Lewandowski, Jeffrey J. Nagy |
2001-04-10 |
| 6205564 |
Optimized built-in self-test method and apparatus for random access memories |
Yervant Zorian |
2001-03-20 |
| 6175936 |
Apparatus for detecting faults in multiple computer memories |
Frank Higgins |
2001-01-16 |
| 6108802 |
Testing method and apparatus for first-in first-out memories |
James L. Lewandowski |
2000-08-22 |
| 5978947 |
Built-in self-test in a plurality of stages controlled by a token passing network and method |
Paul W. Rutkowski, Yervant Zorian |
1999-11-02 |
| 5978935 |
Method for built-in self-testing of ring-address FIFOs having a data input register with transparent latches |
Larry R. Fenstermaker, Yervant Zorian |
1999-11-02 |
| 5473651 |
Method and apparatus for testing large embedded counters |
Miroslaw Guzinski |
1995-12-05 |
| 5420870 |
Non-fully-decoded test address generator |
— |
1995-05-30 |
| 5040228 |
Method and apparatus for automatically focusing an image-acquisition device |
Chinmoy B. Bose |
1991-08-13 |
| 4795920 |
Method and apparatus for sourcing and sinking current |
Charles D. Hechtman |
1989-01-03 |
