Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360221 | Electronic device and method for compensating for depth error according to modulation frequency | Johngy LEE, Hojong Kim, Jaeyoung Huh | 2025-07-15 |
| 11852752 | Cross-talk prevention structure of electronic device for measuring distance to external object | Hyunju Yang, Kihuk LEE | 2023-12-26 |
| 11445098 | Camera assembly and electronic device including same | Wonjun JEONG, Moonkyeong Kim, Junyoung Kim, Jaeyoung Huh | 2022-09-13 |
| 11216070 | Electronic device and method for controlling actuator by utilizing same | Yudong BAE, Jeongseok Lee, Jaeyoung Huh, Donggyu Kim, Kwonho SONG +1 more | 2022-01-04 |
| 8201032 | Generalized BIST for multiport memories | Donald Albert Evans | 2012-06-12 |
| 7254763 | Built-in self test for memory arrays using error correction coding | Duane Rodney Aadsen, Ross A. Kohler, Richard J. McPartland | 2007-08-07 |
| 6397349 | Built-in self-test and self-repair methods and devices for computer memories comprising a reconfiguration memory device | Frank Higgins, Goh Komoriya, Hai Quang Pham, Yervant Zorian | 2002-05-28 |
| 6317846 | System and method for detecting faults in computer memories using a look up table | Frank Higgins, Yervant Zorian | 2001-11-13 |
| 6237123 | Built-in self-test controlled by a token network and method | Paul W. Rutkowski, Yervant Zorian | 2001-05-22 |
| 6216241 | Method and system for testing multiport memories | Larry R. Fenstermaker, Frank Higgins, James L. Lewandowski, Jeffrey J. Nagy | 2001-04-10 |
| 6205564 | Optimized built-in self-test method and apparatus for random access memories | Yervant Zorian | 2001-03-20 |
| 6175936 | Apparatus for detecting faults in multiple computer memories | Frank Higgins | 2001-01-16 |
| 6108802 | Testing method and apparatus for first-in first-out memories | James L. Lewandowski | 2000-08-22 |
| 5978947 | Built-in self-test in a plurality of stages controlled by a token passing network and method | Paul W. Rutkowski, Yervant Zorian | 1999-11-02 |
| 5978935 | Method for built-in self-testing of ring-address FIFOs having a data input register with transparent latches | Larry R. Fenstermaker, Yervant Zorian | 1999-11-02 |
| 5473651 | Method and apparatus for testing large embedded counters | Miroslaw Guzinski | 1995-12-05 |
| 5420870 | Non-fully-decoded test address generator | — | 1995-05-30 |
| 5040228 | Method and apparatus for automatically focusing an image-acquisition device | Chinmoy B. Bose | 1991-08-13 |
| 4795920 | Method and apparatus for sourcing and sinking current | Charles D. Hechtman | 1989-01-03 |