Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5673276 | Boundary-scan-compliant multi-chip module | Chi W. Yau | 1997-09-30 |
| 5444716 | Boundary-scan-based system and method for test and diagnosis | Paul A. Stiling, Enn Tammaru, Chi W. Yau | 1995-08-22 |
| 5331274 | Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan | Chi W. Yau | 1994-07-19 |
| 5155732 | Method and apparatus for data transfer to and from devices through a boundary-scan test access port | Chi W. Yau | 1992-10-13 |
| 5048021 | Method and apparatus for generating control signals | Paul W. Rutkowski, Chi W. Yau | 1991-09-10 |
| 5029166 | Method and apparatus for testing circuit boards | Chi W. Yau | 1991-07-02 |
| 5027353 | Method for testing interconnections | Chi W. Yau | 1991-06-25 |
| 4833677 | Easily testable high speed architecture for large RAMS | Dhiraj K. Pradhan | 1989-05-23 |