TH

Tien-Chen Hu

TSMC: 18 patents #1,811 of 12,232Top 15%
📍 New Taipei, TW: #694 of 10,472 inventorsTop 7%
Overall (All Time): #256,184 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
9852932 Method for processing semiconductor wafer Mao-Lin Kao, Hsu-Shui Liu, Jiun-Rong Pai, Li-Jen Ko, Hsiang Yin Shen 2017-12-26
9558974 Semiconductor processing station and method for processing semiconductor wafer Mao-Lin Kao, Hsu-Shui Liu, Li-Jen Ko, Hsiang Yin Shen, Jiun-Rong Pai 2017-01-31
9281221 Ultra-high vacuum (UHV) wafer processing Chung-En Kao, Mao-Lin Kao, Kuo-Fu Chien, Keith Kuang-Kuo Koai 2016-03-08
8057280 Chemical mechanical planarization apparatus Jung-Sheng Hou, Chun-Chin Huang 2011-11-15
7824243 Chemical mechanical planarization methods Jung-Sheng Hou, Chun-Chin Huang 2010-11-02
7823241 System for cleaning a wafer Chih-Ming Hsieh, Chien-Chang Lai, Wen-Jin Lee, Da-Hsiang Chen 2010-11-02
7014739 Convex profile anode for electroplating system Tro-Hsu Lin, Hong-Jin Pu, Zhi-Zan Zhuang 2006-03-21
6914337 Calibration wafer and kit Chih-Nan Chuang, Tro-Hsu Lin, Cheng-Fang Chang 2005-07-05
6837774 Linear chemical mechanical polishing apparatus equipped with programmable pneumatic support platen and method of using Jih-Churng Twu 2005-01-04
6726532 Belt tensioning assembly for CMP apparatus Hun-Yi Lin, Tso-Hsu Lin, Hong-Chin Pu, Jeng-Fang Chang, Der-Yuan Hong 2004-04-27
6722949 Ventilated platen/polishing pad assembly for chemcial mechanical polishing and method of using Jih-Churng Twu 2004-04-20
6649077 Method and apparatus for removing coating layers from alignment marks on a wafer Pang-Yen Tsai, Sen Yang, Wei-Cheng Ku 2003-11-18
6561880 Apparatus and method for cleaning the polishing pad of a linear polisher Feng-Chih Hsu 2003-05-13
6524959 Chemical mechanical polish (CMP) planarizing method employing derivative signal end-point monitoring and control Chen-Fa Lu, Chen-Peng Fan, Jui-Ping Chuang 2003-02-25
6517413 Method for a copper CMP endpoint detection system Jin-Churng Twu, Chen-Fa Lu 2003-02-11
6315649 Wafer mounting plate for a polishing apparatus and method of using Tsen-Hsing Yi, Chien-Hsien Lee, Ming-Yi Lee 2001-11-13
6227947 Apparatus and method for chemical mechanical polishing metal on a semiconductor wafer Jih-Churng Twu, Ying-Ho Chen, Tsu Shih 2001-05-08
5929324 Apparatus for detecting leakage in a gas reactor Philip J. Lin 1999-07-27