Issued Patents All Time
Showing 25 most recent of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11536765 | Probing apparatus | Kang Fu, Ya-Hung Lo, Shou-Jen Tsai | 2022-12-27 |
| 10295567 | Probe module supporting loopback test | Hao Wei, Jun-Liang Lai, Chih-Hao Ho | 2019-05-21 |
| 10101362 | Probe module with high stability | Hao Wei, Yu-Hao Chen, Chih-Hao Ho | 2018-10-16 |
| 10067163 | Probe card capable of transmitting high-frequency signals | Jun-Liang Lai | 2018-09-04 |
| 10070512 | Multilayer circuit board | Jun-Liang Lai, Chih-Hao Ho | 2018-09-04 |
| 10054627 | Testing jig | Hao Wei, Chia-Nan Chou, Chih-Hao Ho | 2018-08-21 |
| 10033989 | Synchronization controller for multi-sensor camera device and related synchronization method | Tung-Hai Wu, Chung-Hung Tsai, Yuan-Chung Lee | 2018-07-24 |
| 9927487 | Probe card having configurable structure for exchanging or swapping electronic components for impedance matching | Chao-Ching Huang, Chih-Hao Ho | 2018-03-27 |
| 9880252 | Method of calibrating and debugging testing system | Shao-Wei Lu, Hao Wei, Yu-Tse Wang | 2018-01-30 |
| 9835651 | Cantilever type probe card for high frequency signal transmission | Hao Wei, Jun-Liang Lai, Chih-Hao Ho | 2017-12-05 |
| 9759743 | Testing system and method for testing of electrical connections | Shao-Wei Lu, Hao Wei, Yu-Tse Wang | 2017-09-12 |
| 9759746 | Probe module | Hao Wei, Shin-Lan Kao | 2017-09-12 |
| 9678896 | System and method for hardware based security | Daniel O'Loughlin, Keelan Smith, Jay Scott Fuller, William L. Lattin, Marinus Struik +3 more | 2017-06-13 |
| 9658249 | Probe card capable of transmitting high-frequency signals | Jun-Liang Lai | 2017-05-23 |
| 9645197 | Method of operating testing system | Shao-Wei Lu, Hao Wei, Yu-Tse Wang | 2017-05-09 |
| 9622348 | Multilayer circuit board | Jun-Liang Lai, Chun-Chung Huang, Jing-Zhi Hung, Yung Nan Wu, Chih-Hao Ho | 2017-04-11 |
| 9596769 | Multilayer circuit board | Jun-Liang Lai, Chih-Hao Ho | 2017-03-14 |
| 9581676 | Method of calibrating and debugging testing system | Shao-Wei Lu, Hao Wei, Yu-Tse Wang | 2017-02-28 |
| 9545002 | Multilayer circuit board | Jun-Liang Lai, Chih-Hao Ho | 2017-01-10 |
| 9523708 | Electrical testing device | Shao-Wei Lu, Ya-Hung Lo, Shou-Jen Tsai | 2016-12-20 |
| 9519010 | Integrated high-speed probe system | Chun-Chi Wang, Chia-Tai Chang, Ya-Yun Cheng, Chao-Ping Hsieh | 2016-12-13 |
| 9500675 | Probe module supporting loopback test | Jun-Liang Lai, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou, Chan-Hung Huang | 2016-11-22 |
| 9470716 | Probe module | Hao Wei, Chen-Kang CHIU | 2016-10-18 |
| 9459279 | Electrical testing machine | Shao-Wei Lu, Hung-Chih Sung, Chun-Nan Chen | 2016-10-04 |
| 9442134 | Signal path switch and probe card having the signal path switch | Jun-Liang Lai, Chun-Chung Huang, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou | 2016-09-13 |