| 11536765 |
Probing apparatus |
Kang Fu, Ya-Hung Lo, Shou-Jen Tsai |
2022-12-27 |
|
| 10295567 |
Probe module supporting loopback test |
Hao Wei, Jun-Liang Lai, Chih-Hao Ho |
2019-05-21 |
|
| 10101362 |
Probe module with high stability |
Hao Wei, Yu-Hao Chen, Chih-Hao Ho |
2018-10-16 |
|
| 10067163 |
Probe card capable of transmitting high-frequency signals |
Jun-Liang Lai |
2018-09-04 |
|
| 10070512 |
Multilayer circuit board |
Jun-Liang Lai, Chih-Hao Ho |
2018-09-04 |
|
| 10054627 |
Testing jig |
Hao Wei, Chia-Nan Chou, Chih-Hao Ho |
2018-08-21 |
|
| 10033989 |
Synchronization controller for multi-sensor camera device and related synchronization method |
Tung-Hai Wu, Chung-Hung Tsai, Yuan-Chung Lee |
2018-07-24 |
|
| 9927487 |
Probe card having configurable structure for exchanging or swapping electronic components for impedance matching |
Chao-Ching Huang, Chih-Hao Ho |
2018-03-27 |
|
| 9880252 |
Method of calibrating and debugging testing system |
Shao-Wei Lu, Hao Wei, Yu-Tse Wang |
2018-01-30 |
|
| 9835651 |
Cantilever type probe card for high frequency signal transmission |
Hao Wei, Jun-Liang Lai, Chih-Hao Ho |
2017-12-05 |
|
| 9759743 |
Testing system and method for testing of electrical connections |
Shao-Wei Lu, Hao Wei, Yu-Tse Wang |
2017-09-12 |
|
| 9759746 |
Probe module |
Hao Wei, Shin-Lan Kao |
2017-09-12 |
|
| 9678896 |
System and method for hardware based security |
Daniel O'Loughlin, Keelan Smith, Jay Scott Fuller, William L. Lattin, Marinus Struik +3 more |
2017-06-13 |
|
| 9658249 |
Probe card capable of transmitting high-frequency signals |
Jun-Liang Lai |
2017-05-23 |
|
| 9645197 |
Method of operating testing system |
Shao-Wei Lu, Hao Wei, Yu-Tse Wang |
2017-05-09 |
|
| 9622348 |
Multilayer circuit board |
Jun-Liang Lai, Chun-Chung Huang, Jing-Zhi Hung, Yung Nan Wu, Chih-Hao Ho |
2017-04-11 |
|
| 9596769 |
Multilayer circuit board |
Jun-Liang Lai, Chih-Hao Ho |
2017-03-14 |
|
| 9581676 |
Method of calibrating and debugging testing system |
Shao-Wei Lu, Hao Wei, Yu-Tse Wang |
2017-02-28 |
|
| 9545002 |
Multilayer circuit board |
Jun-Liang Lai, Chih-Hao Ho |
2017-01-10 |
|
| 9523708 |
Electrical testing device |
Shao-Wei Lu, Ya-Hung Lo, Shou-Jen Tsai |
2016-12-20 |
|
| 9519010 |
Integrated high-speed probe system |
Chun-Chi Wang, Chia-Tai Chang, Ya-Yun Cheng, Chao-Ping Hsieh |
2016-12-13 |
|
| 9500675 |
Probe module supporting loopback test |
Jun-Liang Lai, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou, Chan-Hung Huang |
2016-11-22 |
|
| 9470716 |
Probe module |
Hao Wei, Chen-Kang CHIU |
2016-10-18 |
|
| 9459279 |
Electrical testing machine |
Shao-Wei Lu, Hung-Chih Sung, Chun-Nan Chen |
2016-10-04 |
|
| 9442134 |
Signal path switch and probe card having the signal path switch |
Jun-Liang Lai, Chun-Chung Huang, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou |
2016-09-13 |
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