Hao Wei — 14 Patents at Mpi | Patent Leaderboard

Hao Wei has been granted 14 US patents while listed as an inventor at Mpi. The first was granted in 2016 and the most recent in August 2025. Hao Wei ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Hao Wei in Zhubeikou, TW.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date
12392803	Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system	Yang-Hung Cheng, Yu-Hao Chen, Jhin-Ying Lyu	2025-08-19
11543430	Probe assembly	Ming-Hsiang Hsieh, Chia-Nan Chou, Chia J. Liu, Chia-An Yu	2023-01-03
10753960	Probe card and signal path switching module assembly	Chia-Nan Chou, Chien-Chiao Chen, Chia-An Yu, Yu-Hao Chen	2020-08-25
10295567	Probe module supporting loopback test	Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho	2019-05-21
10101362	Probe module with high stability	Wei-Cheng Ku, Yu-Hao Chen, Chih-Hao Ho	2018-10-16
10054627	Testing jig	Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho	2018-08-21
9880252	Method of calibrating and debugging testing system	Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang	2018-01-30
9835651	Cantilever type probe card for high frequency signal transmission	Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho	2017-12-05
9759743	Testing system and method for testing of electrical connections	Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang	2017-09-12
9759746	Probe module	Wei-Cheng Ku, Shin-Lan Kao	2017-09-12
9645197	Method of operating testing system	Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang	2017-05-09
9581676	Method of calibrating and debugging testing system	Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang	2017-02-28
9470716	Probe module	Wei-Cheng Ku, Chen-Kang CHIU	2016-10-18
9410986	Testing jig	Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho	2016-08-09

Hao Wei — 14 Patents

Issued Patents All Time

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