Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392803 | Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system | Yang-Hung Cheng, Yu-Hao Chen, Jhin-Ying Lyu | 2025-08-19 |
| 11543430 | Probe assembly | Ming-Hsiang Hsieh, Chia-Nan Chou, Chia J. Liu, Chia-An Yu | 2023-01-03 |
| 10753960 | Probe card and signal path switching module assembly | Chia-Nan Chou, Chien-Chiao Chen, Chia-An Yu, Yu-Hao Chen | 2020-08-25 |
| 10295567 | Probe module supporting loopback test | Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho | 2019-05-21 |
| 10101362 | Probe module with high stability | Wei-Cheng Ku, Yu-Hao Chen, Chih-Hao Ho | 2018-10-16 |
| 10054627 | Testing jig | Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho | 2018-08-21 |
| 9880252 | Method of calibrating and debugging testing system | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2018-01-30 |
| 9835651 | Cantilever type probe card for high frequency signal transmission | Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho | 2017-12-05 |
| 9759743 | Testing system and method for testing of electrical connections | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-09-12 |
| 9759746 | Probe module | Wei-Cheng Ku, Shin-Lan Kao | 2017-09-12 |
| 9645197 | Method of operating testing system | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-05-09 |
| 9581676 | Method of calibrating and debugging testing system | Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang | 2017-02-28 |
| 9470716 | Probe module | Wei-Cheng Ku, Chen-Kang CHIU | 2016-10-18 |
| 9410986 | Testing jig | Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho | 2016-08-09 |