| 12392803 |
Probe card, method for designing probe card, method for producing tested semiconductor device method for testing unpackaged semiconductor by probe card, device under test and probe system |
Yang-Hung Cheng, Yu-Hao Chen, Jhin-Ying Lyu |
2025-08-19 |
| 11543430 |
Probe assembly |
Ming-Hsiang Hsieh, Chia-Nan Chou, Chia J. Liu, Chia-An Yu |
2023-01-03 |
| 10753960 |
Probe card and signal path switching module assembly |
Chia-Nan Chou, Chien-Chiao Chen, Chia-An Yu, Yu-Hao Chen |
2020-08-25 |
| 10295567 |
Probe module supporting loopback test |
Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho |
2019-05-21 |
| 10101362 |
Probe module with high stability |
Wei-Cheng Ku, Yu-Hao Chen, Chih-Hao Ho |
2018-10-16 |
| 10054627 |
Testing jig |
Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho |
2018-08-21 |
| 9880252 |
Method of calibrating and debugging testing system |
Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang |
2018-01-30 |
| 9835651 |
Cantilever type probe card for high frequency signal transmission |
Wei-Cheng Ku, Jun-Liang Lai, Chih-Hao Ho |
2017-12-05 |
| 9759743 |
Testing system and method for testing of electrical connections |
Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang |
2017-09-12 |
| 9759746 |
Probe module |
Wei-Cheng Ku, Shin-Lan Kao |
2017-09-12 |
| 9645197 |
Method of operating testing system |
Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang |
2017-05-09 |
| 9581676 |
Method of calibrating and debugging testing system |
Wei-Cheng Ku, Shao-Wei Lu, Yu-Tse Wang |
2017-02-28 |
| 9470716 |
Probe module |
Wei-Cheng Ku, Chen-Kang CHIU |
2016-10-18 |
| 9410986 |
Testing jig |
Wei-Cheng Ku, Chia-Nan Chou, Chih-Hao Ho |
2016-08-09 |