Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11536765 | Probing apparatus | Kang Fu, Shou-Jen Tsai, Wei-Cheng Ku | 2022-12-27 |
| 11460498 | Adjustable probe device for impedance testing for circuit board | Yang-Hung Cheng, Chien-Hsun Chen, Chia-Nan Chou, Chung-Yen Huang, Shou-Jen Tsai +1 more | 2022-10-04 |
| 9523708 | Electrical testing device | Wei-Cheng Ku, Shao-Wei Lu, Shou-Jen Tsai | 2016-12-20 |