Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11598789 | Probe systems configured to test a device under test and methods of operating the probe systems | Martin Schindler, Torsten Kiel | 2023-03-07 |
| 8402848 | Probe holder | Joerg Kiesewetter, Stojan Kanev | 2013-03-26 |
| 8278951 | Probe station for testing semiconductor substrates and comprising EMI shielding | Stojan Kanev, Hans-Jurgen Fleischer, Karsten Stoll, Axel Schmidt, Andreas Kittlaus | 2012-10-02 |
| 7741860 | Prober for testing magnetically sensitive components | Sebastian Giessmann, Stojan Kanev | 2010-06-22 |
| 7671615 | Method and apparatus for controlling the temperature of electronic components | Carel van de Beek, Volker Hansel, Sebastian Giessmann, Frank-Michael Werner, Claus Dietrich +1 more | 2010-03-02 |
| 7652491 | Probe support with shield for the examination of test substrates under use of probe supports | Stojan Kanev, Hans-Jurgen Fleischer, Karsten Stoll, Axel Schmidt, Andreas Kittlaus | 2010-01-26 |
| 7579854 | Probe station and method for measurements of semiconductor devices under defined atmosphere | Jorg Kiesewetter, Stojan Kanev, Claus Dietrich | 2009-08-25 |
| 7579849 | Probe holder for a probe for testing semiconductor components | Jorg Kiesewetter, Stojan Kanev | 2009-08-25 |
| 7463044 | Adapter for positioning of contact tips | Steffen Schott, Axel Becker, Dietmar Runge | 2008-12-09 |
| 7282930 | Device for testing thin elements | Uwe Beier, Dietmar Runge, Steffen Grauer, Matthias Rottka, Botho Hirschfeld +1 more | 2007-10-16 |
| 7265536 | Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station | Joerg Kiesewetter, Axel Schmidt, Karsten Stoll, Ralph Juettner, Hans-Juergen Fleischer | 2007-09-04 |
| 7235990 | Probe station comprising a bellows with EMI shielding capabilities | Joerg Kiesewetter | 2007-06-26 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Stojan Kanev, Frank Fehrmann +1 more | 2006-06-06 |
| 7038441 | Test apparatus with loading device | Karsten Stoll, Alf Wachtveitl, Michael Teich, Stefan Schneidewind, Claus Dietrich +2 more | 2006-05-02 |