Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11703541 | Semiconductor inspecting method for ensuring scrubbing length on pad | Volker Hansel, Sebastian Giessmann, Chien-Hung Chen | 2023-07-18 |
| 11693050 | Semiconductor inspecting method | Volker Hansel, Sebastian Giessmann, Chien-Hung Chen | 2023-07-04 |
| 10996239 | Method of positioning probe tips relative to pads | Ingo Berg, Chien-Hung Chen, Sebastian Giessmann | 2021-05-04 |
| 9373533 | Systems and methods for providing wafer access in a wafer processing system | Botho Hirschfeld, Stojan Kanev | 2016-06-21 |
| 9110131 | Method and device for contacting a row of contact areas with probe tips | Claus Dietrich, Stojan Kanev, Botho Hirschfeld | 2015-08-18 |
| 8368413 | Method for testing electronic components of a repetitive pattern under defined thermal conditions | Stojan Kanev, Jens Fiedler, Claus Dietrich, Jorg Kiesewetter | 2013-02-05 |
| 7573283 | Method for measurement of a device under test | Axel Schmidt, Ulf Hackius, Stojan Kanev, Steffen Laube, Jorg Kiesewetter | 2009-08-11 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Stojan Kanev, Stefan Kreissig +1 more | 2006-06-06 |