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USPTO Patent Rankings Data through Dec 31, 2025
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Frank Fehrmann — 8 Patents

CMCascade Microtech: 2 patents #67 of 118Top 60%
SGSuss Microtec Test Systems Gmbh: 2 patents #12 of 33Top 40%
MPMpi: 1 patents #100 of 183Top 55%
Großenhain, DE: #12 of 108 inventorsTop 15%
Overall (All Time): #600,572 of 4,157,543Top 15%
8 Patents All Time
Frank Fehrmann has been granted 8 US patents while listed as an inventor at Cascade Microtech. The first was granted in 2006 and the most recent in July 2023. Frank Fehrmann ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Frank Fehrmann in Großenhain, DE.

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11703541 Semiconductor inspecting method for ensuring scrubbing length on pad Volker Hansel, Sebastian Giessmann, Chien-Hung Chen 2023-07-18
11693050 Semiconductor inspecting method Volker Hansel, Sebastian Giessmann, Chien-Hung Chen 2023-07-04
10996239 Method of positioning probe tips relative to pads Ingo Berg, Chien-Hung Chen, Sebastian Giessmann 2021-05-04
9373533 Systems and methods for providing wafer access in a wafer processing system Botho Hirschfeld, Stojan Kanev 2016-06-21 $1,812,000
9110131 Method and device for contacting a row of contact areas with probe tips Claus Dietrich, Stojan Kanev, Botho Hirschfeld 2015-08-18 $1,979,000
8368413 Method for testing electronic components of a repetitive pattern under defined thermal conditions Stojan Kanev, Jens Fiedler, Claus Dietrich, Jorg Kiesewetter 2013-02-05
7573283 Method for measurement of a device under test Axel Schmidt, Ulf Hackius, Stojan Kanev, Steffen Laube, Jorg Kiesewetter 2009-08-11
7057408 Method and prober for contacting a contact area with a contact tip Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Stojan Kanev, Stefan Kreissig +1 more 2006-06-06