Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing electronic components of a repetitive pattern under defined thermal conditions

Method for testing electronic components of a repetitive pattern under defined thermal conditions

US Patent 8368413 · Granted Feb 5, 2013

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe system and machine apparatus thereof2025
Method and device for optically representing electronic semiconductor components2023
Semiconductor inspecting method for ensuring scrubbing length on pad2023
Semiconductor inspecting method2023
Method for compensating to distance between probe tip and device under test afte2022
Wafer probe station2022
Control method of touch display apparatus2021
Display method of display apparatus2021
Method of positioning probe tips relative to pads2021
Wafer probe station2021
Method for compensating probe misplacement and probe apparatus2019
Method of determining hydraulic operating point of a pump2019