Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196779 | Probe system and machine apparatus thereof | Stojan Kanev, MEI-TING LU | 2025-01-14 |
| 12196808 | Motorized chuck stage controlling method | Yu-Hsun Hsu | 2025-01-14 |
| 12092658 | Optical detection system and alignment method for a predetermined target object | Po-Yi Ting | 2024-09-17 |
| 12007319 | Optical path correction subassembly, optical detection assembly, and optical detection system | Po-Yi Ting, TING-AN YEN, Yu-Hsun Hsu | 2024-06-11 |
| 11703541 | Semiconductor inspecting method for ensuring scrubbing length on pad | Volker Hansel, Frank Fehrmann, Chien-Hung Chen | 2023-07-18 |
| 11693050 | Semiconductor inspecting method | Volker Hansel, Frank Fehrmann, Chien-Hung Chen | 2023-07-04 |
| 11313883 | Probe station capable of maintaining position of probe tip upon temperature change | Yu-Hsun Hsu, Jhih-Wei Fang | 2022-04-26 |
| 10996239 | Method of positioning probe tips relative to pads | Ingo Berg, Chien-Hung Chen, Frank Fehrmann | 2021-05-04 |
| 10895587 | Wafer probe station | Yu-Hsun Hsu, Jhih-Wei Fang, Stojan Kanev | 2021-01-19 |
| 9983232 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Matthias Zieger | 2018-05-29 |
| 8841932 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Matthias Zieger | 2014-09-23 |
| 7932737 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Matthias Zieger | 2011-04-26 |
| 7741860 | Prober for testing magnetically sensitive components | Stefan Kreissig, Stojan Kanev | 2010-06-22 |
| 7671615 | Method and apparatus for controlling the temperature of electronic components | Carel van de Beek, Stefan Kreissig, Volker Hansel, Frank-Michael Werner, Claus Dietrich +1 more | 2010-03-02 |