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USPTO Patent Rankings Data through Dec 31, 2025
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Sebastian Giessmann — 14 Patents

MPMpi: 7 patents #15 of 183Top 9%
CMCascade Microtech: 3 patents #52 of 118Top 45%
SGSuss Microtec Test Systems Gmbh: 1 patents #17 of 33Top 55%
Dashulong, TW: #157 of 596 inventorsTop 30%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Sebastian Giessmann has been granted 14 US patents while listed as an inventor at Mpi. The first was granted in 2010 and the most recent in January 2025. Sebastian Giessmann ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Sebastian Giessmann in Dashulong, TW.

Patents per Year

Patents granted per year, 2010 to 2025Bar chart with a peak of 2 patents in 2010.peak 22010: 2 patents20102011: 1 patents20112014: 1 patents20142018: 1 patents20182021: 2 patents20212022: 1 patents20222023: 2 patents20232024: 2 patents20242025: 2 patents2025

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12196808 Motorized chuck stage controlling method Yu-Hsun Hsu 2025-01-14
12196779 Probe system and machine apparatus thereof Stojan Kanev, MEI-TING LU 2025-01-14
12092658 Optical detection system and alignment method for a predetermined target object Po-Yi Ting 2024-09-17
12007319 Optical path correction subassembly, optical detection assembly, and optical detection system Po-Yi Ting, TING-AN YEN, Yu-Hsun Hsu 2024-06-11
11703541 Semiconductor inspecting method for ensuring scrubbing length on pad Volker Hansel, Frank Fehrmann, Chien-Hung Chen 2023-07-18
11693050 Semiconductor inspecting method Volker Hansel, Frank Fehrmann, Chien-Hung Chen 2023-07-04
11313883 Probe station capable of maintaining position of probe tip upon temperature change Yu-Hsun Hsu, Jhih-Wei Fang 2022-04-26
10996239 Method of positioning probe tips relative to pads Ingo Berg, Chien-Hung Chen, Frank Fehrmann 2021-05-04
10895587 Wafer probe station Yu-Hsun Hsu, Jhih-Wei Fang, Stojan Kanev 2021-01-19
9983232 Prober for testing devices in a repeat structure on a substrate Frank-Michael Werner, Matthias Zieger 2018-05-29
8841932 Prober for testing devices in a repeat structure on a substrate Frank-Michael Werner, Matthias Zieger 2014-09-23 $1,464,000
7932737 Prober for testing devices in a repeat structure on a substrate Frank-Michael Werner, Matthias Zieger 2011-04-26 $1,227,000
7741860 Prober for testing magnetically sensitive components Stefan Kreissig, Stojan Kanev 2010-06-22
7671615 Method and apparatus for controlling the temperature of electronic components Carel van de Beek, Stefan Kreissig, Volker Hansel, Frank-Michael Werner, Claus Dietrich +1 more 2010-03-02

Frequent Collaborators

Yu-Hsun Hsu4 shared
Frank-Michael Werner4 shared
Stojan Kanev3 shared
Matthias Zieger3 shared
Volker Hansel3 shared
Chien-Hung Chen3 shared

Nearby-Ranked Inventors

Ke PAN14
Naor Radami14
Jason Harris14
Gwangjae Jeon14
Masao Zen14
Yoshihiro YAMASAKI14
Sanjay Vakil14
Samuel Bartlett14
Taketoshi Okuno14