Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12196808 | Motorized chuck stage controlling method | Sebastian Giessmann | 2025-01-14 |
| 12007319 | Optical path correction subassembly, optical detection assembly, and optical detection system | Po-Yi Ting, TING-AN YEN, Sebastian Giessmann | 2024-06-11 |
| 11353501 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Guan-Jhih Liou | 2022-06-07 |
| 11313883 | Probe station capable of maintaining position of probe tip upon temperature change | Jhih-Wei Fang, Sebastian Giessmann | 2022-04-26 |
| 11287475 | Method for compensating to distance between probe tip and device under test after temperature changes | Stojan Kanev, Chien-Hung Chen | 2022-03-29 |
| 10976363 | Wafer inspection method and wafer probing system | Lin-Lin Chih, Chien-Hung Chen, Guan-Jhih Liou | 2021-04-13 |
| 10895587 | Wafer probe station | Jhih-Wei Fang, Stojan Kanev, Sebastian Giessmann | 2021-01-19 |
| 10312123 | Method for compensating probe misplacement and probe apparatus | Chen Chen, Po-Yi Ting, Stojan Kanev | 2019-06-04 |
| 9958477 | Testing machine and operation method thereof | Ban-Ban Lim | 2018-05-01 |