Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wafer inspection method and wafer probing system

Wafer inspection method and wafer probing system

US Patent 10976363 · Granted Apr 13, 2021

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Contact features of semiconductor devices2025
Lens assembly2025
System and method for obtaining instrumentation data2025
Integrated circuit layout including standard cells and method to form the same2025
Integrated circuit, method for forming a layout of integrated circuit using stan2025
Semiconductor structure and manufacturing method thereof2025
System and method for selecting instrumentation technique2025
Static random access memory2025
Heat dissipating features for laser drilling process2025
Package assembly including lid with additional stress mitigating feet and method2025
Wafer scheduling method and wafer scheduling apparatus for etching equipment2025
Fin field-effect transistor device and method of forming the same2025