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Prober for testing devices in a repeat structure on a substrate |
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2018-05-29 |
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Prober for testing devices in a repeat structure on a substrate |
Matthias Zieger, Sebastian Giessmann |
2014-09-23 |
| 7932737 |
Prober for testing devices in a repeat structure on a substrate |
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2011-04-26 |
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Method and apparatus for controlling the temperature of electronic components |
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Apparatus for testing substrates |
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Test apparatus for testing substrates at low temperatures |
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2006-05-16 |