Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9983232 | Prober for testing devices in a repeat structure on a substrate | Matthias Zieger, Sebastian Giessmann | 2018-05-29 |
| 8841932 | Prober for testing devices in a repeat structure on a substrate | Matthias Zieger, Sebastian Giessmann | 2014-09-23 |
| 7932737 | Prober for testing devices in a repeat structure on a substrate | Matthias Zieger, Sebastian Giessmann | 2011-04-26 |
| 7671615 | Method and apparatus for controlling the temperature of electronic components | Carel van de Beek, Stefan Kreissig, Volker Hansel, Sebastian Giessmann, Claus Dietrich +1 more | 2010-03-02 |
| 7196507 | Apparatus for testing substrates | Stefan Schneidewind, Claus Dietrich, Don Feuerstein, Mike Lancaster, Denis Place | 2007-03-27 |
| 7046025 | Test apparatus for testing substrates at low temperatures | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Axel Schmidt, Matthias Zieger | 2006-05-16 |