Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9983232 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Sebastian Giessmann | 2018-05-29 |
| 8841932 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Sebastian Giessmann | 2014-09-23 |
| 7932737 | Prober for testing devices in a repeat structure on a substrate | Frank-Michael Werner, Sebastian Giessmann | 2011-04-26 |
| 7046025 | Test apparatus for testing substrates at low temperatures | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Frank-Michael Werner, Axel Schmidt | 2006-05-16 |