Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9110131 | Method and device for contacting a row of contact areas with probe tips | Stojan Kanev, Frank Fehrmann, Botho Hirschfeld | 2015-08-18 |
| 8368413 | Method for testing electronic components of a repetitive pattern under defined thermal conditions | Stojan Kanev, Frank Fehrmann, Jens Fiedler, Jorg Kiesewetter | 2013-02-05 |
| 8094925 | Method for increasing the accuracy of the positioning of a first object relative to a second object | Stefan Schneidewind, Jorg Kiesewetter, Michael Teich, Thomas Tharigen | 2012-01-10 |
| 7859278 | Probe holder for a probe for testing semiconductor components | Dietmar Runge, Stojan Kanev | 2010-12-28 |
| 7671615 | Method and apparatus for controlling the temperature of electronic components | Carel van de Beek, Stefan Kreissig, Volker Hansel, Sebastian Giessmann, Frank-Michael Werner +1 more | 2010-03-02 |
| 7579854 | Probe station and method for measurements of semiconductor devices under defined atmosphere | Jorg Kiesewetter, Stefan Kreissig, Stojan Kanev | 2009-08-25 |
| 7196507 | Apparatus for testing substrates | Stefan Schneidewind, Frank-Michael Werner, Don Feuerstein, Mike Lancaster, Denis Place | 2007-03-27 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Jorg Kiesewetter, Stojan Kanev, Stefan Kreissig, Frank Fehrmann +1 more | 2006-06-06 |
| 7046025 | Test apparatus for testing substrates at low temperatures | Stefan Schneidewind, Jorg Kiesewetter, Frank-Michael Werner, Axel Schmidt, Matthias Zieger | 2006-05-16 |
| 7038441 | Test apparatus with loading device | Karsten Stoll, Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind +2 more | 2006-05-02 |
| 6864676 | Substrate-holding device for testing circuit arrangements on substrates | Jorg Kiesewetter, Michael Teich, Stefan Schneidewind | 2005-03-08 |
| 6688156 | Tester for pressure sensors | Botho Hirschfeld, Dietmar Runge, Michael Teich, Stefan Schneidewind | 2004-02-10 |
| 6373272 | Arrangement for the testing of semiconductor structures | Reinhard Welsch, Thomas Huelsmann, Dietmar Runge | 2002-04-16 |