Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8368413 | Method for testing electronic components of a repetitive pattern under defined thermal conditions | Stojan Kanev, Frank Fehrmann, Jens Fiedler, Claus Dietrich | 2013-02-05 |
| 8240650 | Chuck with triaxial construction | Michael Teich, Karsten Stoll, Axel Schmidt, Stojan Kanev | 2012-08-14 |
| 8094925 | Method for increasing the accuracy of the positioning of a first object relative to a second object | Stefan Schneidewind, Claus Dietrich, Michael Teich, Thomas Tharigen | 2012-01-10 |
| 7733108 | Method and arrangement for positioning a probe card | Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kressig | 2010-06-08 |
| 7671615 | Method and apparatus for controlling the temperature of electronic components | Carel van de Beek, Stefan Kreissig, Volker Hansel, Sebastian Giessmann, Frank-Michael Werner +1 more | 2010-03-02 |
| 7659743 | Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer | Stojan Kanev | 2010-02-09 |
| 7579849 | Probe holder for a probe for testing semiconductor components | Stefan Kreissig, Stojan Kanev | 2009-08-25 |
| 7579854 | Probe station and method for measurements of semiconductor devices under defined atmosphere | Stefan Kreissig, Stojan Kanev, Claus Dietrich | 2009-08-25 |
| 7573283 | Method for measurement of a device under test | Axel Schmidt, Frank Fehrmann, Ulf Hackius, Stojan Kanev, Steffen Laube | 2009-08-11 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Claus Dietrich, Stojan Kanev, Stefan Kreissig, Frank Fehrmann +1 more | 2006-06-06 |
| 7046025 | Test apparatus for testing substrates at low temperatures | Stefan Schneidewind, Claus Dietrich, Frank-Michael Werner, Axel Schmidt, Matthias Zieger | 2006-05-16 |
| 7038441 | Test apparatus with loading device | Karsten Stoll, Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind +2 more | 2006-05-02 |
| 6864676 | Substrate-holding device for testing circuit arrangements on substrates | Michael Teich, Stefan Schneidewind, Claus Dietrich | 2005-03-08 |