Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632108 | Method for verifying a test substrate in a prober under defined thermal conditions | Michael Teich, Stojan Kanev | 2017-04-25 |
| 8692567 | Method for verifying a test substrate in a prober under defined thermal conditions | Michael Teich, Stojan Kanev | 2014-04-08 |
| 8278951 | Probe station for testing semiconductor substrates and comprising EMI shielding | Stojan Kanev, Stefan Kreissig, Karsten Stoll, Axel Schmidt, Andreas Kittlaus | 2012-10-02 |
| 7733108 | Method and arrangement for positioning a probe card | Stojan Kanev, Stefan Kressig, Jorg Kiesewetter | 2010-06-08 |
| 7652491 | Probe support with shield for the examination of test substrates under use of probe supports | Stojan Kanev, Stefan Kreissig, Karsten Stoll, Axel Schmidt, Andreas Kittlaus | 2010-01-26 |
| 7560942 | Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus | Axel Schmidt, Stojan Kanev, Axel Becker | 2009-07-14 |
| 7057408 | Method and prober for contacting a contact area with a contact tip | Stefan Schneidewind, Claus Dietrich, Jorg Kiesewetter, Stojan Kanev, Stefan Kreissig +1 more | 2006-06-06 |