Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8278951 | Probe station for testing semiconductor substrates and comprising EMI shielding | Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Karsten Stoll, Axel Schmidt | 2012-10-02 |
| 7652491 | Probe support with shield for the examination of test substrates under use of probe supports | Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Karsten Stoll, Axel Schmidt | 2010-01-26 |