Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10281492 | Shielded probe systems with controlled testing environments | Michael Teich, Walter Matthias Clauss, Swen Schmiedchen | 2019-05-07 |
| 9784763 | Shielded probe systems with controlled testing environments | Michael Teich, Walter Matthias Clauss, Swen Schmiedchen | 2017-10-10 |
| 9395411 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Joerg Kiesewetter, Stojan Kanev, Michael Teich, Axel Schmidt | 2016-07-19 |
| 8680879 | Chuck for supporting and retaining a test substrate and a calibration substrate | Andrej Rumiantsev, Stojan Kanev, Steffen Schott | 2014-03-25 |
| 8497693 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Joerg Kiesewetter, Stojan Kanev, Michael Teich, Axel Schmidt | 2013-07-30 |
| 8278951 | Probe station for testing semiconductor substrates and comprising EMI shielding | Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Axel Schmidt, Andreas Kittlaus | 2012-10-02 |
| 8240650 | Chuck with triaxial construction | Michael Teich, Axel Schmidt, Stojan Kanev, Jorg Kiesewetter | 2012-08-14 |
| 7999563 | Chuck for supporting and retaining a test substrate and a calibration substrate | Andrej Rumiantsev, Stojan Kanev, Steffen Scott | 2011-08-16 |
| 7652491 | Probe support with shield for the examination of test substrates under use of probe supports | Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Axel Schmidt, Andreas Kittlaus | 2010-01-26 |
| 7265536 | Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station | Joerg Kiesewetter, Axel Schmidt, Stefan Kreissig, Ralph Juettner, Hans-Juergen Fleischer | 2007-09-04 |
| 7038441 | Test apparatus with loading device | Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind, Claus Dietrich +2 more | 2006-05-02 |