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USPTO Patent Rankings Data through Dec 31, 2025
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Karsten Stoll — 11 Patents

CMCascade Microtech: 7 patents #31 of 118Top 30%
SGSuss Microtec Test Systems Gmbh: 3 patents #10 of 33Top 35%
FBFormfactor Beaverton: 1 patents #11 of 39Top 30%
Wilthen, DE: #3 of 35 inventorsTop 9%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
Karsten Stoll has been granted 11 US patents while listed as an inventor at Cascade Microtech. The first was granted in 2006 and the most recent in May 2019. Karsten Stoll ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Karsten Stoll in Wilthen, DE.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10281492 Shielded probe systems with controlled testing environments Michael Teich, Walter Matthias Clauss, Swen Schmiedchen 2019-05-07
9784763 Shielded probe systems with controlled testing environments Michael Teich, Walter Matthias Clauss, Swen Schmiedchen 2017-10-10
9395411 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Joerg Kiesewetter, Stojan Kanev, Michael Teich, Axel Schmidt 2016-07-19
8680879 Chuck for supporting and retaining a test substrate and a calibration substrate Andrej Rumiantsev, Stojan Kanev, Steffen Schott 2014-03-25 $1,207,000
8497693 Method for testing a test substrate under defined thermal conditions and thermally conditionable prober Joerg Kiesewetter, Stojan Kanev, Michael Teich, Axel Schmidt 2013-07-30 $782,000
8278951 Probe station for testing semiconductor substrates and comprising EMI shielding Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Axel Schmidt, Andreas Kittlaus 2012-10-02 $993,000
8240650 Chuck with triaxial construction Michael Teich, Axel Schmidt, Stojan Kanev, Jorg Kiesewetter 2012-08-14 $960,000
7999563 Chuck for supporting and retaining a test substrate and a calibration substrate Andrej Rumiantsev, Stojan Kanev, Steffen Scott 2011-08-16 $838,000
7652491 Probe support with shield for the examination of test substrates under use of probe supports Stojan Kanev, Hans-Jurgen Fleischer, Stefan Kreissig, Axel Schmidt, Andreas Kittlaus 2010-01-26
7265536 Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station Joerg Kiesewetter, Axel Schmidt, Stefan Kreissig, Ralph Juettner, Hans-Juergen Fleischer 2007-09-04
7038441 Test apparatus with loading device Stefan Kreissig, Alf Wachtveitl, Michael Teich, Stefan Schneidewind, Claus Dietrich +2 more 2006-05-02