Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Chuck for supporting and retaining a test substrate and a calibration substrate

Chuck for supporting and retaining a test substrate and a calibration substrate

US Patent 8680879 · Granted Mar 25, 2014

Estimated economic value: $1,207,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe system and machine apparatus thereof2025
Method for compensating to distance between probe tip and device under test afte2022
Wafer probe station2022
Control method of touch display apparatus2021
Pressure valve2021
Display method of display apparatus2021
Wafer probe station2021
Method for compensating probe misplacement and probe apparatus2019
Shielded probe systems with controlled testing environments2019
Wafer cassette2018
Operating method for inspecting equipment2018
Operating method for inspecting equipment2018