| 10048844 |
Operating method for inspecting equipment |
Stojan Kanev, Yung-Chin Liu, YAO-CHUAN CHIANG |
2018-08-14 |
| 8680879 |
Chuck for supporting and retaining a test substrate and a calibration substrate |
Stojan Kanev, Steffen Schott, Karsten Stoll |
2014-03-25 |
| 8344744 |
Probe station for on-wafer-measurement under EMI-shielding |
Axel Schmidt, Botho Hirschfeld, Stojan Kanev, Michael Teich |
2013-01-01 |
| 7999563 |
Chuck for supporting and retaining a test substrate and a calibration substrate |
Stojan Kanev, Steffen Scott, Karsten Stoll |
2011-08-16 |
| 7768271 |
Method for calibration of a vectorial network analyzer having more than two ports |
Steffen Schott, Stojan Kanev |
2010-08-03 |
| 7769555 |
Method for calibration of a vectorial network analyzer |
Steffen Schott, Stojan Kanev |
2010-08-03 |