Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10048844 | Operating method for inspecting equipment | Stojan Kanev, Yung-Chin Liu, YAO-CHUAN CHIANG | 2018-08-14 |
| 8680879 | Chuck for supporting and retaining a test substrate and a calibration substrate | Stojan Kanev, Steffen Schott, Karsten Stoll | 2014-03-25 |
| 8344744 | Probe station for on-wafer-measurement under EMI-shielding | Axel Schmidt, Botho Hirschfeld, Stojan Kanev, Michael Teich | 2013-01-01 |
| 7999563 | Chuck for supporting and retaining a test substrate and a calibration substrate | Stojan Kanev, Steffen Scott, Karsten Stoll | 2011-08-16 |
| 7768271 | Method for calibration of a vectorial network analyzer having more than two ports | Steffen Schott, Stojan Kanev | 2010-08-03 |
| 7769555 | Method for calibration of a vectorial network analyzer | Steffen Schott, Stojan Kanev | 2010-08-03 |