Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9395411 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Stojan Kanev, Michael Teich, Karsten Stoll, Axel Schmidt | 2016-07-19 |
| 8497693 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Stojan Kanev, Michael Teich, Karsten Stoll, Axel Schmidt | 2013-07-30 |
| 8402848 | Probe holder | Stojan Kanev, Stefan Kreissig | 2013-03-26 |
| 8072586 | Arrangement and method for focusing a multiplane image acquisition on a prober | Michael Teich, Ulf Hackius, Juliane Busch, Axel Becker | 2011-12-06 |
| 7282930 | Device for testing thin elements | Uwe Beier, Dietmar Runge, Stefan Kreissig, Steffen Grauer, Matthias Rottka +1 more | 2007-10-16 |
| 7265536 | Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station | Axel Schmidt, Stefan Kreissig, Karsten Stoll, Ralph Juettner, Hans-Juergen Fleischer | 2007-09-04 |
| 7235990 | Probe station comprising a bellows with EMI shielding capabilities | Stefan Kreissig | 2007-06-26 |